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  2. 地质与地球物理研究所
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  4. 中国科学院地球与行星物理重点实验室
Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials

文献类型：期刊论文

作者Gu, Lixin1,4,5; Wang, Nian5,6; Tang, Xu1,4,5; Changela, H. G.1,2,3,5
刊名SCANNING
出版日期2020-07-25
卷号2020页码:15
ISSN号0161-0457
DOI10.1155/2020/8406917
英文摘要Advanced microanalytical techniques such as high-resolution transmission electron microscopy (HRTEM), atom probe tomography (APT), and synchrotron-based scanning transmission X-ray microscopy (STXM) enable one to characterize the structure and chemical and isotopic compositions of natural materials down towards the atomic scale. Dual focused ion beam-scanning electron microscopy (FIB-SEM) is a powerful tool for site-specific sample preparation and subsequent analysis by TEM, APT, and STXM to the highest energy and spatial resolutions. FIB-SEM also works as a stand-alone technique for three-dimensional (3D) tomography. In this review, we will outline the principles and challenges when using FIB-SEM for the advanced characterization of natural materials in the Earth and Planetary Sciences. More specifically, we aim to highlight the state-of-the-art applications of FIB-SEM using examples including (a) traditional FIB ultrathin sample preparation of small particles in the study of space weathering of lunar soil grains, (b) migration of Pb isotopes in zircons by FIB-based APT, (c) coordinated synchrotron-based STXM characterization of extraterrestrial organic material in carbonaceous chondrite, and finally (d) FIB-based 3D tomography of oil shale pores by slice and view methods. Dual beam FIB-SEM is a powerful analytical platform, the scope of which, for technological development and adaptation, is vast and exciting in the field of Earth and Planetary Sciences. For example, dual beam FIB-SEM will be a vital technique for the characterization of fine-grained asteroid and lunar samples returned to the Earth in the near future.
WOS关键词FOCUSED-ION-BEAM ; ATOM-PROBE TOMOGRAPHY ; SCANNING-ELECTRON-MICROSCOPY ; X-RAY-ABSORPTION ; SAMPLE PREPARATION ; MASS-SPECTROMETRY ; ORGANIC-MATTER ; LONGMAXI FORMATION ; PORE STRUCTURE ; SICHUAN BASIN
资助项目Instrument Function Developing Project of the Chinese Academy of Sciences[IGG201901]
WOS研究方向Instruments & Instrumentation ; Microscopy
语种英语
WOS记录号WOS:000559269700002
出版者WILEY-HINDAWI
资助机构Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences ; Instrument Function Developing Project of the Chinese Academy of Sciences
源URL[http://ir.iggcas.ac.cn/handle/132A11/97636]  
专题地质与地球物理研究所_中国科学院地球与行星物理重点实验室
通讯作者Gu, Lixin
作者单位1.Chinese Acad Sci, Innovat Acad Earth Sci, Beijing 10029, Peoples R China
2.Chinese Acad Space Technol, Qian Xuesen Lab Space Technol, Beijing, Peoples R China
3.Univ New Mexico, Dept Earth & Planetary Sci, Albuquerque, NM 87131 USA
4.Chinese Acad Sci, Inst Geol & Geophys, Electron Microscopy Lab, Beijing, Peoples R China
5.Chinese Acad Sci, Inst Geol & Geophys, Key Lab Earth & Planetary Phys, Beijing, Peoples R China
6.Univ Chinese Acad Sci, Beijing, Peoples R China
推荐引用方式
GB/T 7714		 Gu, Lixin,Wang, Nian,Tang, Xu,et al. Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials[J]. SCANNING,2020,2020:15.
APA Gu, Lixin,Wang, Nian,Tang, Xu,&Changela, H. G..(2020).Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials.SCANNING,2020,15.
MLA Gu, Lixin,et al."Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials".SCANNING 2020(2020):15.

入库方式： OAI收割

来源：地质与地球物理研究所

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