Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors
文献类型：期刊论文
| 作者 | Zhang, Ying1; Chakrabarty, Krishnendu2; Peng, Zebo3; Rezine, Ahmed3; Li, Huawei4; Eles, Petru3; Jiang, Jianhui1 |
| 刊名 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
 |
| 出版日期 | 2020-03-01 |
| 卷号 | 39期号:3页码:714-727 |
| 关键词 | Circuit faults Built-in self-test Out of order Model checking Integrated circuit modeling Bounded model checking (BMC) online testing out-of-order superscalar processors software-based self-testing (SBST) |
| ISSN号 | 0278-0070 |
| DOI | 10.1109/TCAD.2018.2890695 |
| 英文摘要 | Generating functional tests for processors has been a challenging problem for decades in the very large-scale integration testing field. This paper presents a method that generates software-based self-tests by leveraging bounded model checking (BMC) techniques and targeting, for the first time, out-of-order [out-of-order execution (OOE)] superscalar processors. To combat the state-space explosion associated with BMC, the proposed method starts by combining module-level abstraction-refinement with slicing to reduce the size of the model under verification. Next, an off-the-shelf BMC solver is used on the obtained extended finite-state machines to generate the leading sequences that are necessary to excite internal processor functions. Finally, constrained automatic test-pattern generation is used to cover all structural faults within every function excited by the obtained leading sequences. Experimental results show that the proposed method leads to extremely high fault coverage on the critical components corresponding to OOE operations in functional mode. The method therefore helps in tackling the over-testing problem that is inherent to the full-scan test approach. |
| 资助项目 | National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61404092] ; National Natural Science Foundation of China[61876173] ; Fundamental Research Funds for the Central Universities ; Duke University |
| WOS研究方向 | Computer Science ; Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000520102700014 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/14095]  |
| 专题 | 中国科学院计算技术研究所期刊论文_英文 |
| 通讯作者 | Zhang, Ying |
| 作者单位 | 1.Tongji Univ, Shanghai 201804, Peoples R China 2.Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA 3.Linkoeping Univ, Linkoping, Sweden 4.Chinese Acad Sci, Inst Comp Technol, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang, Ying,Chakrabarty, Krishnendu,Peng, Zebo,et al. Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,2020,39(3):714-727. |
| APA | Zhang, Ying.,Chakrabarty, Krishnendu.,Peng, Zebo.,Rezine, Ahmed.,Li, Huawei.,...&Jiang, Jianhui.(2020).Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS,39(3),714-727. |
| MLA | Zhang, Ying,et al."Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors".IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 39.3(2020):714-727. |
入库方式： OAI收割
来源：计算技术研究所
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