A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw-Hall measurement
文献类型：期刊论文
| 作者 | Qing, Fangzhu3,5; Shu, Yang5; Qing, Linsen4; Niu, Yuting5; Guo, He5; Zhang, Shuyi5; Liu, Chunlin5; Shen, Changqing5; Zhang, Wanli5; Mao, Samuel S.1,6 |
| 刊名 | SCIENCE BULLETIN
 |
| 出版日期 | 2019-11-30 |
| 卷号 | 63期号:2018页码:1521-1526 |
| ISSN号 | 2095-9273 |
| 关键词 | Graphene Van der Pauw Hall Chemical vapor deposition (CVD) |
| DOI | 10.1016/j.scib.2018.10.007 |
| 产权排序 | 2 |
| 文献子类 | Article |
| 英文摘要 | Expected for many promising applications in the field of electronics and optoelectronics, a reliable method for the characterization of graphene electrical transport properties is desired to predict its device performance or provide feedback for its synthesis. However, the commonly used methods of extracting carrier mobility from graphene field effect transistor or Hall-bar is time consuming, expensive, and significantly affected by the device fabrication process other than graphene itself. Here we reported a general and simple method to evaluate the electrical transport performance of graphene by the van der Pauw-Hall measurement. By annealing graphene in vacuum to remove the adsorbed dopants and then exposing it in ambient surroundings, carrier mobility as a function of density can be measured with the increase of carrier density due to the dopant re-adsorption from the surroundings. Further, the relationship between the carrier mobility and density can be simply fitted with a power equation to the first level approximation, with which any pair of measured carrier mobility and density can be normalized to an arbitrary carrier density for comparison. We experimentally demonstrated the reliability of the method, which is much simpler than making devices and may promote the standard making for graphene characterization. (C) 2018 Science China Press. Published by Elsevier B.V. and Science China Press. All rights reserved. |
| 学科主题 | Multidisciplinary |
| URL标识 | 查看原文 |
| WOS关键词 | CARRIER MOBILITY ; HIGH-QUALITY ; TRANSISTORS ; FILMS |
| WOS研究方向 | Science & Technology |
| 语种 | 英语 |
| CSCD记录号 | CSCD:6409054 |
| 出版者 | SCIENCE PRESS |
| WOS记录号 | WOS:000451638000011 |
| 源URL | [http://210.75.237.14/handle/351003/30101]  |
| 专题 | 国家天然药物工程技术研究中心_天然产物研究 |
| 作者单位 | 1.Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA; 2.Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA 3.Univ Elect Sci & Technol China, Natl Engn Res Ctr Electromagnet Radiat Control Ma, Chengdu 610054, Sichuan, Peoples R China; 4.Chinese Acad Sci, Chengdu Inst Biol, Chengdu 610041, Sichuan, Peoples R China; 5.State Key Laboratory of Electronic Thin Films and Integrated Devices & School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China; 6.Inst New Energy, Shenzhen 518031, Peoples R China; |
| 推荐引用方式 GB/T 7714 | Qing, Fangzhu,Shu, Yang,Qing, Linsen,et al. A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw-Hall measurement[J]. SCIENCE BULLETIN,2019,63(2018):1521-1526. |
| APA | Qing, Fangzhu.,Shu, Yang.,Qing, Linsen.,Niu, Yuting.,Guo, He.,...&Li, Xuesong.(2019).A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw-Hall measurement.SCIENCE BULLETIN,63(2018),1521-1526. |
| MLA | Qing, Fangzhu,et al."A general and simple method for evaluating the electrical transport performance of graphene by the van der Pauw-Hall measurement".SCIENCE BULLETIN 63.2018(2019):1521-1526. |
入库方式： OAI收割
来源：成都生物研究所
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