中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Low Temperature Joining and High Temperature Application of Segmented Half Heusler/Skutterudite Thermoelectric Joints

文献类型:期刊论文

作者Wang, WA; Li, XY; Gu, M; Xing, YF; Bao, YF
刊名MATERIALS
出版日期2020
期号1
DOI10.3390/ma13010155
文献子类Article
英文摘要A low temperature joining process has been developed to fabricate segmented half Heusler/skutterudite thermoelectric joints, and high temperature service behavior of the joints has been studied. The microstructure and electrical resistance across the joint before and after aging were investigated. The joint is well bonded and no cracks appear at the interfaces of the joint before and after aging, which can attribute to the formation of high melting point intermetallic compounds. The electrical resistance crosses the bonding layer smoothly and the contact resistance is low. These results show the process is effective, and promising for preparation of segmented thermoelectric devices.
WOS关键词POWER-GENERATION ; MICROSTRUCTURAL EVOLUTION ; NANOCOMPOSITES ; FABRICATION ; EFFICIENCY ; PROGRESS ; DEVICES
WOS研究方向Materials Science
语种英语
出版者MDPI
源URL[http://ir.sic.ac.cn/handle/331005/28392]  
专题中国科学院上海硅酸盐研究所
推荐引用方式
GB/T 7714
Wang, WA,Li, XY,Gu, M,et al. Low Temperature Joining and High Temperature Application of Segmented Half Heusler/Skutterudite Thermoelectric Joints[J]. MATERIALS,2020(1).
APA Wang, WA,Li, XY,Gu, M,Xing, YF,&Bao, YF.(2020).Low Temperature Joining and High Temperature Application of Segmented Half Heusler/Skutterudite Thermoelectric Joints.MATERIALS(1).
MLA Wang, WA,et al."Low Temperature Joining and High Temperature Application of Segmented Half Heusler/Skutterudite Thermoelectric Joints".MATERIALS .1(2020).

入库方式: OAI收割

来源:上海硅酸盐研究所

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