A study of hot pixels induced by proton and neutron irradiations in charge coupled devices
文献类型：期刊论文
| 作者 | Liu, BK (Liu, Bingkai)[ 1,2,3 ]; Li, YD (Li, Yudong)[ 1,2 ] ; Wen, L (Wen, Lin)[ 1,2 ]; Zhou, D (Zhou, Dong)[ 1,2 ]; Feng, J (Feng, Jie)[ 1,2 ]; Ma, LD (Ma, Lindong)[ 1,2,3 ]; Zhang, X (Zhang, Xiang)[ 1,2,3 ]; Cai, YL (Cai, Yulong)[ 1,2,3 ]; Wang, ZM (Wang, Zhiming)[ 1,2,3 ]; Fu, J (Fu, Jing)[ 1,2,3 ]
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| 刊名 | RADIATION EFFECTS AND DEFECTS IN SOLIDS
 |
| 出版日期 | 2020 |
| 卷号 | 175期号:5-6页码:540-550 |
| 关键词 | Charge coupled devices (CCDs) proton irradiation neutron irradiation hot pixels displacement damage effects |
| ISSN号 | 1042-0150 |
| DOI | 10.1080/10420150.2019.1701470 |
| 英文摘要 | Charge coupled devices with high sensitivity and low dark current were irradiated separately by 10 MeV proton, 14 and 1 MeV neutron up to the fluences of 10(9) cm(-)(2). The generation pattern of hot pixels at different conditions is presented. The experimental results demonstrate that the nuclear inelastic scattering is the dominant generation mechanism of hot pixels induced by proton and neutron irradiations. Meanwhile, a theoretical model is used to predict hot pixel tails at different annealing time points and different operating temperatures. |
| WOS记录号 | WOS:000532610100013 |
| 源URL | [http://ir.xjipc.cas.cn/handle/365002/7368]  |
| 专题 | 新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室 固体辐射物理研究室 |
| 通讯作者 | Li, YD (Li, Yudong)[ 1,2 ] |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Tech Phys, Key Lab Infrared Imaging Mat & Detectors, Shanghai, Peoples R China 2.Univ Chinese Acad Sci, Beijing, Peoples R China 3.Xinjiang Key Lab Elect Informat Mat & Device, Urumqi, Peoples R China 4.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi, Peoples R China |
| 推荐引用方式 GB/T 7714 | Liu, BK ,Li, YD ,Wen, L ,et al. A study of hot pixels induced by proton and neutron irradiations in charge coupled devices[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS,2020,175(5-6):540-550. |
| APA | Liu, BK .,Li, YD .,Wen, L .,Zhou, D .,Feng, J .,...&Ma, D .(2020).A study of hot pixels induced by proton and neutron irradiations in charge coupled devices.RADIATION EFFECTS AND DEFECTS IN SOLIDS,175(5-6),540-550. |
| MLA | Liu, BK ,et al."A study of hot pixels induced by proton and neutron irradiations in charge coupled devices".RADIATION EFFECTS AND DEFECTS IN SOLIDS 175.5-6(2020):540-550. |
入库方式： OAI收割
来源：新疆理化技术研究所
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