Investigation of displacement damage to vertical-cavity surface-emitting red lasers due to 1 MeV electron radiation
文献类型:期刊论文
作者 | Chen, JW (Chen, J. W.)[ 1,2 ]; Li, YD (Li, Y. D.)[ 1 ]![]() ![]() ![]() ![]() |
刊名 | AIP ADVANCES
![]() |
出版日期 | 2020 |
卷号 | 10期号:11页码:1-6 |
ISSN号 | 2158-3226 |
DOI | 10.1063/5.0029695 |
英文摘要 | The effects of displacement damage due to 1 MeV electron radiation on 680 nm and 850 nm vertical-cavity surface-emitting lasers (VCSELs) were experimentally investigated. The displacement damage dose was calculated using the MULASSIS tool, where it was found that radiation significantly affects the threshold current of VCSELs. The threshold current damage factor is 2.46 x 10(-18) cm(2)/e for 680 nm VCSELs and 1.48 x 10(-18) cm(2)/e for 850 nm VCSELs. In addition, the power intensity distribution and light output power degradation were characterized to evaluate the radiation hardness of VCSELs. An understanding of the performance degradation of VCSELs under electron exposure would be useful in optimizing their applications in hostile environments. |
WOS记录号 | WOS:000595065000001 |
源URL | [http://ir.xjipc.cas.cn/handle/365002/7699] ![]() |
专题 | 新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室 固体辐射物理研究室 |
通讯作者 | Li, YD (Li, Y. D.)[ 1 ] |
作者单位 | 1.Univ Chinese Acad Sci, 19-A Yuquan Rd, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Device Special Environm, 40-1 South Beijing Rd, Urumqi 830011, Peoples R China |
推荐引用方式 GB/T 7714 | Chen, JW ,Li, YD ,Heini, M ,et al. Investigation of displacement damage to vertical-cavity surface-emitting red lasers due to 1 MeV electron radiation[J]. AIP ADVANCES,2020,10(11):1-6. |
APA | Chen, JW .,Li, YD .,Heini, M .,Liu, BK .,Lei, QQ .,...&Aierke, A .(2020).Investigation of displacement damage to vertical-cavity surface-emitting red lasers due to 1 MeV electron radiation.AIP ADVANCES,10(11),1-6. |
MLA | Chen, JW ,et al."Investigation of displacement damage to vertical-cavity surface-emitting red lasers due to 1 MeV electron radiation".AIP ADVANCES 10.11(2020):1-6. |
入库方式: OAI收割
来源:新疆理化技术研究所
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。