Microstructure evolution of pure tungsten after low-energy and high-fluence He+ implantation assessed by synchrotron grazing incidence X-ray diffraction
文献类型:期刊论文
作者 | Huang, W. J.1,2; Sun, M.1,2; Yang, J. F.1; Wen, W.3; Xie, Z. M.1; Zhang, L. C.1; Liu, R.1; Chen, C. A.4; Jiang, Y.5; Wang, X. P.1 |
刊名 | JOURNAL OF NUCLEAR MATERIALS |
出版日期 | 2021-02-01 |
卷号 | 544 |
ISSN号 | 0022-3115 |
关键词 | Helium ion implantation Tungsten Synchrotron X-Ray diffraction Nanoindentation |
DOI | 10.1016/j.jnucmat.2020.152663 |
通讯作者 | Yang, J. F.(jfyang@issp.ac.cn) |
英文摘要 | A clear understanding on the H/He plasma implantation behavior in the plasma facing materials is a key issue to manage the implanted H/He in a future nuclear fusion reactor. In this work, the microstructure evolution of pure tungsten after low-energy (100 eV) and high-fluence (10(23)similar to 10(24)/m(2)) helium ion implantation was investigated by the synchrotron grazing incidence X-ray diffraction (S-GIXRD) and nanoindentation. Benefiting from the depth dependence of S-GIXRD and nanoindentation, it was found that the unimplanted W surface layer was composed of two zones: the compressed zone with a thickness of similar to 56 +/- 2 nm under the top surface, which was introduced by the mechanical polishing, and the unaffected matrix. The helium implanted W surface layer was composed of four zones along the direction from the top surface to deep depth: the compressed zone with a thickness of similar to 46 +/- 10 nm, transition zone with a thickness of similar to 146 +/- 14 nm, expanded zone, and the matrix. The compressed zone becomes thinner after He implantation possibly owing to the formation of He-complexes. The expanded zone resulted from the helium atoms entering into the tungsten lattice, while the transition zone is a result of competition between the expanding and compressing effects. (C) 2020 Elsevier B.V. All rights reserved. |
WOS关键词 | MECHANICAL-PROPERTIES ; POLYCRYSTALLINE TUNGSTEN ; HELIUM ; IRRADIATION ; HYDROGEN |
资助项目 | National Key Research and Development Program of China[2017YFA0402800] ; National Key Research and Development Program of China[2017YFE0300402] ; National Key Research and Development Program of China[2017YFE0302400] ; National Natural Science Foundation of China[51971213] ; National Natural Science Foundation of China[11674319] ; National Natural Science Foundation of China[51671184] ; National Natural Science Foundation of China[51801203] ; Natural Science Foundation of Anhui Province[1808085QE132] ; Science and Technology on Surface Physics and Chemistry Laboratory[JZX7Y201901SY0 0900103] |
WOS研究方向 | Materials Science ; Nuclear Science & Technology |
语种 | 英语 |
出版者 | ELSEVIER |
WOS记录号 | WOS:000608773400003 |
资助机构 | National Key Research and Development Program of China ; National Natural Science Foundation of China ; Natural Science Foundation of Anhui Province ; Science and Technology on Surface Physics and Chemistry Laboratory |
源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/119793] |
专题 | 中国科学院合肥物质科学研究院 |
通讯作者 | Yang, J. F. |
作者单位 | 1.Chinese Acad Sci, Inst Solid State Phys, Key Lab Mat Phys, Hefei 230031, Peoples R China 2.Univ Sci & Technol China, Dept Mat Sci & Engn, Hefei 230026, Peoples R China 3.Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai 201204, Peoples R China 4.China Acad Engn Phys, Inst Mat, Jiangyou 621907, Peoples R China 5.Panzhihua Univ, Int Inst Vanadium & Titanium, Panzhihua 617000, Peoples R China |
推荐引用方式 GB/T 7714 | Huang, W. J.,Sun, M.,Yang, J. F.,et al. Microstructure evolution of pure tungsten after low-energy and high-fluence He+ implantation assessed by synchrotron grazing incidence X-ray diffraction[J]. JOURNAL OF NUCLEAR MATERIALS,2021,544. |
APA | Huang, W. J..,Sun, M..,Yang, J. F..,Wen, W..,Xie, Z. M..,...&Fang, Q. F..(2021).Microstructure evolution of pure tungsten after low-energy and high-fluence He+ implantation assessed by synchrotron grazing incidence X-ray diffraction.JOURNAL OF NUCLEAR MATERIALS,544. |
MLA | Huang, W. J.,et al."Microstructure evolution of pure tungsten after low-energy and high-fluence He+ implantation assessed by synchrotron grazing incidence X-ray diffraction".JOURNAL OF NUCLEAR MATERIALS 544(2021). |
入库方式: OAI收割
来源:合肥物质科学研究院
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