中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Exoplanet detection methods and transit spectrometer equipment of astronomical telescopes

文献类型:会议论文

作者Wang Fang1,2; Fan Xuewu1,2; Wang Hu1,2; Shen Yang1; Pan Yue1,2
出版日期2020
会议日期2020-08-25
会议地点Xiamen, PEOPLES R CHINA
关键词exoplanet detection method transit spectrometry optical instrument project spectrometer payload optical system parameters
卷号11567
DOI10.1117/12.2579795
英文摘要

With the continuous development of astronomy theory and space exploration technology, searching for extrasolar planets has become one of the most active research topics in astronomy. In recent decades, countries around the world have invested a lot of ground and space projects in this search field and obtained abundant results. Firstly, this paper summarizes the mainstream exoplanet detection methods such as radial velocity, transit and direct imaging method with the outline of the principles and features. Then, several instruments for obtaining the spectrum of exoplanets are introduced, focusing on the optical system parameters of telescopes and spectrometers. Finally, according to the comprehensive discussion above, the future development trend of exploration missions and instrument design in this field is predicted, and it is recognized that these survey missions for detecting and characterizing exoplanets are of great significance for searching biological signals outside the solar system.

产权排序1
会议录AOPC 2020: OPTICAL SENSING AND IMAGING TECHNOLOGY
会议录出版者SPIE-INT SOC OPTICAL ENGINEERING
语种英语
ISSN号0277-786X;1996-764X
ISBN号978-1-5106-3956-0
WOS记录号WOS:000651815600079
源URL[http://ir.opt.ac.cn/handle/181661/94781]  
专题西安光学精密机械研究所_空间光学应用研究室
通讯作者Wang Fang
作者单位1.Xian Inst Opt & Precis Mech CAS, Xian 710119, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Wang Fang,Fan Xuewu,Wang Hu,et al. Exoplanet detection methods and transit spectrometer equipment of astronomical telescopes[C]. 见:. Xiamen, PEOPLES R CHINA. 2020-08-25.

入库方式: OAI收割

来源:西安光学精密机械研究所

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