中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigating the effect of source contamination on eXTP/SFA

文献类型:会议论文

作者Zhang, Juan1; Li, Gang1; Ge, Mingyu1; Kirsch, Christian2; Lorenz, Maximilian2; Wilms, Joern2; Qi, Liqiang1; Sheng, Lizhi3; Yang, Yi-Jung1; Dauser, Thomas2
出版日期2020
会议日期2020-12-14
会议地点Virtual, Online, CA, United states
关键词eXTP/SFA nearby source contamination
卷号11444
DOI10.1117/12.2561944
英文摘要

The Spectroscopy Focusing Array (SFA) onboard the enhanced X-ray Timing and Polarimetry (eXTP) observatory consists of 9 modules, each comprising a Wolter type I telescope with a field of view (FOV) around 16 arcminutes and a focal plane silicon drift detector (SDD) with 19 hexagonal pixels. Due to the large size of each individual SDD pixel (each pixel corresponds to an area of ∼ 3.6 arcminutes in diameter) and the limited pixel number, SFA can not obtain a real image of the observed region like many other X-ray imaging telescopes. Thus, contamination from nearby bright sources needs to be considered when we study the properties of the target source. We simulate such contaminations using the SIXTE simulator. In this paper we present the results by taking observations of the millisecond pulsar PSR J0437-4715 as an example, and discuss the cases for contamination on background or target source respectively. © 2020 SPIE

产权排序3
会议录Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
会议录出版者SPIE
语种英语
ISSN号0277786X;1996756X
ISBN号9781510636750
源URL[http://ir.opt.ac.cn/handle/181661/94268]  
专题西安光学精密机械研究所_光电子学研究室
通讯作者Zhang, Juan
作者单位1.Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing; 100049, China;
2.Remeis Observatory and ECAP, University Erlangen-Nurnberg, Sternwartstr. 7, Bamberg; 96049, Germany;
3.XIOPM, Xi'an Institute of Optics and Precision Mechanics, CAS, NO.17 Xinxi Road, Xi'an, Shanxi, China
推荐引用方式
GB/T 7714
Zhang, Juan,Li, Gang,Ge, Mingyu,et al. Investigating the effect of source contamination on eXTP/SFA[C]. 见:. Virtual, Online, CA, United states. 2020-12-14.

入库方式: OAI收割

来源:西安光学精密机械研究所

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