Real-time in situ observation of extended defect evolution near a crack tip in GaSb crystal under thermal loading
文献类型：期刊论文
| 作者 | Yingbin Zhu; Huihui Wen; Hongye Zhang; Zhanwei Liu; Chao Liu; Shuman Liu |
| 刊名 | APPLIED SURFACE SCIENCE
 |
| 出版日期 | 2020 |
| 卷号 | 515页码:145934 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30227]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Yingbin Zhu; Huihui Wen; Hongye Zhang; Zhanwei Liu; Chao Liu; Shuman Liu. Real-time in situ observation of extended defect evolution near a crack tip in GaSb crystal under thermal loading[J]. APPLIED SURFACE SCIENCE,2020,515:145934. |
| APA | Yingbin Zhu; Huihui Wen; Hongye Zhang; Zhanwei Liu; Chao Liu; Shuman Liu.(2020).Real-time in situ observation of extended defect evolution near a crack tip in GaSb crystal under thermal loading.APPLIED SURFACE SCIENCE,515,145934. |
| MLA | Yingbin Zhu; Huihui Wen; Hongye Zhang; Zhanwei Liu; Chao Liu; Shuman Liu."Real-time in situ observation of extended defect evolution near a crack tip in GaSb crystal under thermal loading".APPLIED SURFACE SCIENCE 515(2020):145934. |
入库方式： OAI收割
来源：半导体研究所
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