Model-assisted linear extended state observer for opto-electronic stabilized platform
文献类型：会议论文
| 作者 | Nie, Kang1,2,3; Ren, Wei1,2,3; Qiao, Qi1,2,3; Zhou, Xi1,2,3; Deng, Jiuqiang1,2,3; Mao, Yao1,2,3 |
| 出版日期 | 2019-06-01 |
| 会议日期 | June 6, 2019 - June 8, 2019 |
| 会议地点 | Jinzhou, China |
| DOI | 10.1109/YAC.2019.8787695 |
| 页码 | 370-374 |
| 英文摘要 | In this paper, a control strategy with a model-assisted linear extended state observer (MLESO) is proposed to enhance the disturbance suppression performance for OptoElectronic stabilized platform. First, we incorporate known model information which can be identified from the open loop frequency response of controlled plant in the framework of the presented linear extended state observer (LESO), for the degree and high order gain of the controlled plant are enough. The tuning parameters of observer gain and controller gain are reduced to two: observer bandwidth and controller bandwidth. Then, constructing a MLESO can estimate and compensate the generalized disturbance to stabilize line of sight (LOS). Simulation results indicate that system with MLESO shows a stronger disturbance rejection ability in low and medium frequency by a simple linear PD control law, compared with traditional single position closed-loop control system. © 2019 IEEE |
| 会议录 | Proceedings - 2019 34rd Youth Academic Annual Conference of Chinese Association of Automation, YAC 2019
 |
| 会议录出版者 | Institute of Electrical and Electronics Engineers Inc. |
| 文献子类 | 会议论文 |
| 语种 | 英语 |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/9598]  |
| 专题 | 光电技术研究所_光电工程总体研究室（一室） |
| 作者单位 | 1.Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu, China; 2.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China; 3.University of Chinese Academy of Sciences, Beijing, China |
| 推荐引用方式 GB/T 7714 | Nie, Kang,Ren, Wei,Qiao, Qi,et al. Model-assisted linear extended state observer for opto-electronic stabilized platform[C]. 见:. Jinzhou, China. June 6, 2019 - June 8, 2019. |
入库方式： OAI收割
来源：光电技术研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。