Radon single-pixel imaging with projective sampling
文献类型:期刊论文
作者 | Dongfeng, Shi1,2,6; Jian, Huang1,2; Wenwen, Meng1,2; Kaixin, Yin5; Baoqing, Sun4; Yingjian, Wang1,2; Kee, Yuan1,2,3; Chenbo, Xie1,2; Dong, Liu1,2; Wenyue, Zhu1,2 |
刊名 | Optics Express |
出版日期 | 2019-05-13 |
卷号 | 27期号:10页码:14594-14609 |
ISSN号 | 1094-4087 |
DOI | 10.1364/OE.27.014594 |
文献子类 | 期刊论文 |
英文摘要 | A novel technique for Radon single-pixel imaging with projective sampling, which is based on the theorem of the Radon transform, is proposed. In contrast to current patterns in conventional single-pixel imaging systems, candy-striped patterns called Radon basis patterns, which are produced by projecting the 1D Hadamard functions along different angles, are employed in our proposed technique. Here, the patterns are loaded into a projection system and then illuminated onto an object. The light reflected from the object is detected by a single-pixel detector. An iterative reconstruction method is used to restore the object's 1D projection functions by summing the 1D Hadamard functions and detected intensities. Next, the Radon spectrum of the object is recovered by arranging the 1D projection functions along the projection angle. Finally, the image of the object can be recovered using a filtered back-projection algorithm with the Radon spectrum. Experiments demonstrate that the proposed technique can obtain the information of the Radon spectrum and image of the object. Recognition directly in the Radon spectrum domain, rather than in the image domain, is fast and yields robust and high classification rates. A recognition experiment is performed by detecting the lines in one scene by searching the singular peaks in the Radon spectrum domain. According to the results, the lines in the scene can be easily detected in the Radon spectrum domain. Other shapes can also be detected by the characteristics of those shapes in the Radon spectrum domain. © 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement |
WOS关键词 | CAMERA ; VIDEO |
WOS研究方向 | Optics |
语种 | 英语 |
出版者 | OSA - The Optical Society |
WOS记录号 | WOS:000469220500087 |
源URL | [http://ir.ioe.ac.cn/handle/181551/9766] |
专题 | 光电技术研究所_光电工程总体研究室(一室) |
作者单位 | 1.Key Laboratory of Atmospheric Optics, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei; 230031, China; 2.University of Science and Technology of China, Hefei; 230026, China; 3.State Key Laboratory of Pulsed Power Laser Technology, Hefei; 230037, China 4.School of Information Science and Engineering, Shandong University, Qingdao; 250100, China; 5.Research Center for Laser Physics and Technology, Key Lab of Functional Crystal and Laser Technology, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing; 100190, China; 6.Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu; 610209, China; |
推荐引用方式 GB/T 7714 | Dongfeng, Shi,Jian, Huang,Wenwen, Meng,et al. Radon single-pixel imaging with projective sampling[J]. Optics Express,2019,27(10):14594-14609. |
APA | Dongfeng, Shi.,Jian, Huang.,Wenwen, Meng.,Kaixin, Yin.,Baoqing, Sun.,...&Wenyue, Zhu.(2019).Radon single-pixel imaging with projective sampling.Optics Express,27(10),14594-14609. |
MLA | Dongfeng, Shi,et al."Radon single-pixel imaging with projective sampling".Optics Express 27.10(2019):14594-14609. |
入库方式: OAI收割
来源:光电技术研究所
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