中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A Novel Nanoimprint Lithography Thiol-ene Resist for Sub-70 nm Nanostructures

文献类型:期刊论文

作者Zhang, Man; Xia, Liang-Ping; Dang, Sui-Hu; Cao, A-Xiu; Deng, Qi-Ling; Du, Chun-Lei
刊名SCIENCE OF ADVANCED MATERIALS
出版日期2020-06-01
卷号12期号:6页码:779-783
关键词Thiol-ene Copolymers Nanoimprint Lithography Resist Young's Modulus Surface Energy
ISSN号1947-2935
DOI10.1166/sam.2020.3721
文献子类期刊论文
英文摘要

In this paper, we propose a novel kind of UV click-polymerization thiol-ene copolymers as nanoimprint lithography resists for sub-70 nm resolution patterns. High-precision mold imprint and release are two of the most critical steps of nanoimprint lithography, which requires the resists with properties of excellent conformal replication and low surface energy. Conventional UV-curable resists used in nanoimprint lithography, such as acrylate, epoxy resin, and vinyl ether, cannot satisfy all these properties requirements because they exhibit surface oxygen inhibition during polymerization, or materials fracture and delamination during mold releasing. A novel kind of thiol-ene copolymers have been investigated in this study, which have many properties favorable for use as nanoimprint lithography resists to imprint sub-70 nm and high-aspect-ratio nanostructures. These properties include sufficiently low viscosity and high Young's modulus, low surface energy for easy demolding, polymerization in benign ambient, and in particular, high chemical-etch resistance. These excellent properties give improve nanoimprinting results.

出版地VALENCIA
WOS关键词Imprint Lithography ; Copolymers ; Surface ; Performance ; Stability ; Behavior ; Block
WOS研究方向Science & Technology - Other Topics ; Materials Science ; Physics
语种英语
WOS记录号WOS:000522735300001
出版者AMER SCIENTIFIC PUBLISHERS
源URL[http://ir.ioe.ac.cn/handle/181551/10133]  
专题光电技术研究所_微电子装备总体研究室(四室)
作者单位1.Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China
2.[Zhang, Man
3.Xia, Liang-Ping
4.Dang, Sui-Hu
5.Yangtze Normal Univ, Sch Elect Informat Engn, Chongqing 408100, Peoples R China
6.[Zhang, Man
7.Cao, A-Xiu
8.Chinese Acad Sci, Inst Opt & Elect, Chengdu 610209, Peoples R China
9.[Xia, Liang-Ping
推荐引用方式
GB/T 7714
Zhang, Man,Xia, Liang-Ping,Dang, Sui-Hu,et al. A Novel Nanoimprint Lithography Thiol-ene Resist for Sub-70 nm Nanostructures[J]. SCIENCE OF ADVANCED MATERIALS,2020,12(6):779-783.
APA Zhang, Man,Xia, Liang-Ping,Dang, Sui-Hu,Cao, A-Xiu,Deng, Qi-Ling,&Du, Chun-Lei.(2020).A Novel Nanoimprint Lithography Thiol-ene Resist for Sub-70 nm Nanostructures.SCIENCE OF ADVANCED MATERIALS,12(6),779-783.
MLA Zhang, Man,et al."A Novel Nanoimprint Lithography Thiol-ene Resist for Sub-70 nm Nanostructures".SCIENCE OF ADVANCED MATERIALS 12.6(2020):779-783.

入库方式: OAI收割

来源:光电技术研究所

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