中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Fabrication and damage characteristics of low stress HR films for femtosecond laser system

文献类型:会议论文

作者Long, Guoyun1,2; Zhang, Yaoping1
出版日期2019
会议日期November 26, 2018 - November 28, 2018
会议地点Hefei, China
关键词Low stress femtosecond Laser damage
卷号11068
DOI10.1117/12.2524519
页码110681F
英文摘要With the development of femtosecond laser system, the laser damage threshold of optical components becomes more important. Meanwhile, in order to obtain better laser beam quality and avoid wavefront distortion caused by optical components, more stringent requirements are put forward for the surface shape of the coated surface of mirrors. HfO2-SiO2 high reflective films were fabricated by e-beam thermal evaporation method. Internal stress of the multilayer dielectrics was modulated by changing the design of films and coating process. Finally, the film with an absolute internal stress less than 100MPa was obtained. The laser damage characteristics of the films at 35fs, 1000Hz were studied, and the damage mechanism was analyzed. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
会议录Proceedings of SPIE 11068 - Second Symposium on Novel Technology of X-Ray Imaging
会议录出版者SPIE
文献子类会议论文
语种英语
ISSN号0277-786X
WOS研究方向Engineering, Electrical & Electronic ; Optics ; Imaging Science & Photographic Technology
WOS记录号WOS:000473327700050
源URL[http://ir.ioe.ac.cn/handle/181551/9630]  
专题光电技术研究所_自适应光学技术研究室(八室)
作者单位1.Institute of Optics and Electronics, Chinese Academy of Science, Chengdu; 610209, China;
2.University of Chinese Academy of Sciences, Beijing; 100049, China
推荐引用方式
GB/T 7714
Long, Guoyun,Zhang, Yaoping. Fabrication and damage characteristics of low stress HR films for femtosecond laser system[C]. 见:. Hefei, China. November 26, 2018 - November 28, 2018.

入库方式: OAI收割

来源:光电技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。