Measuring the topological charge of vortex beams by using Shack-Hartmann wavefront sensor with sector microlens array
文献类型：会议论文
| 作者 | Tang, Ao2,3,4; Shen, Feng3,4; Lan, Bin3,4; Ge, Yingjian2,3,4; Li, Jian2,3,4; Duan, YiHui1,2,3 |
| 出版日期 | 2020-07-12 |
| 会议日期 | December 3, 2019 - December 5, 2019 |
| 会议地点 | Beijing, China |
| 卷号 | 11455 |
| DOI | 10.1117/12.2565218 |
| 页码 | 1145568 |
| 英文摘要 | We presented a new method to measure the topological charge (TC) of the vortex beam (VB) by use a Shack-Hartmann wavefront sensor with sector microlens array (SMLA). The SMLA is circularly symmetric, which perfectly corresponds to helical phase and ring intensity of the VB. On the focal plane, there are spot array with circular distribution due to the special arrangement of the SMLA. In this letter, we also analyzed the error, and concluded that the error of the outer ring is smaller. As a result, we only employed the data of the outermost ring. This method easily can obtain the sign and magnitude of the TC by calculating offset direction and offset of the spots respectively. The simulation results show that our method can determine large TCs and has high accuracy. While this method has a simple structure and can be used in optical communications in the future. © 2020 SPIE. |
| 会议录 | Proceedings of SPIE 11455 - Sixth Symposium on Novel Optoelectronic Detection Technology and Applications
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| 文献子类 | 会议论文 |
| 语种 | 英语 |
| ISSN号 | 0277-786X |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/9900]  |
| 专题 | 光电技术研究所_自适应光学技术研究室（八室） |
| 作者单位 | 1.Key Laboratory of Microfabrication Optic, Chinese Academy of Sciences, Chengdu; 610209, China; 2.University of Chinese Academy of Sciences, Beijing; 100049, China 3.Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu; 610209, China; 4.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China; |
| 推荐引用方式 GB/T 7714 | Tang, Ao,Shen, Feng,Lan, Bin,et al. Measuring the topological charge of vortex beams by using Shack-Hartmann wavefront sensor with sector microlens array[C]. 见:. Beijing, China. December 3, 2019 - December 5, 2019. |
入库方式： OAI收割
来源：光电技术研究所
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