Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution
文献类型:期刊论文
作者 | Weijie Kong; Changtao Wang; Mingbo Pu; Xiaoliang Ma; Xiong Li; Xiangang Luo |
刊名 | IEEE Photonics Journal |
出版日期 | 2020-12-17 |
卷号 | 13期号:1页码:4500109 |
ISSN号 | 1943-0647 |
关键词 | Imaging , Lighting , Spatial resolution , Microscopy , Optical surface waves , Optical microscopy , Optical imaging |
DOI | 10.1109/JPHOT.2020.3044920 |
文献子类 | 期刊论文 |
英文摘要 | Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility. |
语种 | 英语 |
源URL | [http://ir.ioe.ac.cn/handle/181551/10152] |
专题 | 光电技术研究所_微细加工光学技术国家重点实验室(开放室) |
通讯作者 | Xiangang Luo |
作者单位 | State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China
School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China |
推荐引用方式 GB/T 7714 | Weijie Kong,Changtao Wang,Mingbo Pu,et al. Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution[J]. IEEE Photonics Journal,2020,13(1):4500109. |
APA | Weijie Kong,Changtao Wang,Mingbo Pu,Xiaoliang Ma,Xiong Li,&Xiangang Luo.(2020).Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution.IEEE Photonics Journal,13(1),4500109. |
MLA | Weijie Kong,et al."Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution".IEEE Photonics Journal 13.1(2020):4500109. |
入库方式: OAI收割
来源:光电技术研究所
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