中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution

文献类型:期刊论文

作者Weijie Kong; Changtao Wang; Mingbo Pu; Xiaoliang Ma; Xiong Li; Xiangang Luo
刊名IEEE Photonics Journal
出版日期2020-12-17
卷号13期号:1页码:4500109
ISSN号1943-0647
关键词Imaging , Lighting , Spatial resolution , Microscopy , Optical surface waves , Optical microscopy , Optical imaging
DOI10.1109/JPHOT.2020.3044920
文献子类期刊论文
英文摘要Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility.
语种英语
源URL[http://ir.ioe.ac.cn/handle/181551/10152]  
专题光电技术研究所_微细加工光学技术国家重点实验室(开放室)
通讯作者Xiangang Luo
作者单位State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Weijie Kong,Changtao Wang,Mingbo Pu,et al. Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution[J]. IEEE Photonics Journal,2020,13(1):4500109.
APA Weijie Kong,Changtao Wang,Mingbo Pu,Xiaoliang Ma,Xiong Li,&Xiangang Luo.(2020).Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution.IEEE Photonics Journal,13(1),4500109.
MLA Weijie Kong,et al."Bloch Surface Wave Assisted Structured Illumination Microscopy for Sub-100 nm Resolution".IEEE Photonics Journal 13.1(2020):4500109.

入库方式: OAI收割

来源:光电技术研究所

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