A wavelength-dispersive X-ray spectrometer for in/ex situ resonant inelastic X-ray scattering studies
文献类型：期刊论文
| 作者 | Mei, BB; Gu, SQ; Du, XL; Li, ZL; Cao, HJ; Song, F; Huang, YY; Jiang, Z |
| 刊名 | X-RAY SPECTROMETRY
 |
| 出版日期 | 2019 |
| 页码 | - |
| 关键词 | ELECTROCHEMICAL REDUCTION SPECTROSCOPY CO2 CATALYST CERIA XAS |
| ISSN号 | 0049-8246 |
| DOI | 10.1002/xrs.3132 |
| 文献子类 | 期刊论文 |
| 英文摘要 | A wavelength-dispersive X-ray spectrometer based on von Hamos geometry for in/ex situ resonant inelastic X-ray scattering (RIXS) studies at BL14W1-X-ray absorption fine structure (XAFS) beamline of Shanghai Synchrotron Radiation Facility (SSRF) is reported. The design considerations and the operational characteristics of the spectrometer are described in detail. With a Si(444) bent crystal, the spectrometer provides an energy range from 8 to 9 keV, which enables the measurement of K-edge X-ray spectroscopy of some transition metal complexes and L-edge X-ray spectroscopy of some 5d transition metal complexes. Based on von Hamos geometry, the process of the collection of RIXS is considerably simplified. The collection of full RIXS planes of tungstic samples requiring spectral resolutions is presented, demonstrating the speciation capabilities of the instrument. Taking the series of oxide-derived copper catalysts for carbon dioxide electrochemical reduction as the research model, the in situ RIXS were measured to probe dynamic changes in electronic structure. Finally, the comparison between in situ RIXS and in situ conventional XAFS is presented, demonstrating more competitive spectral resolution of RIXS. |
| 语种 | 英语 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/31956]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai, Peoples R China; 2.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai, Peoples R China; 3.Univ Chinese Acad Sci, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Mei, BB,Gu, SQ,Du, XL,et al. A wavelength-dispersive X-ray spectrometer for in/ex situ resonant inelastic X-ray scattering studies[J]. X-RAY SPECTROMETRY,2019:-. |
| APA | Mei, BB.,Gu, SQ.,Du, XL.,Li, ZL.,Cao, HJ.,...&Jiang, Z.(2019).A wavelength-dispersive X-ray spectrometer for in/ex situ resonant inelastic X-ray scattering studies.X-RAY SPECTROMETRY,-. |
| MLA | Mei, BB,et al."A wavelength-dispersive X-ray spectrometer for in/ex situ resonant inelastic X-ray scattering studies".X-RAY SPECTROMETRY (2019):-. |
入库方式： OAI收割
来源：上海应用物理研究所
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