中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability

文献类型:期刊论文

作者Chang-Jun Li; Zong-Shi Xie; Xin-Ran Peng; Bo Li
刊名International Journal of Automation and Computing
出版日期2019
卷号16期号:2页码:186-198
关键词Performance evaluation and improvement chipset assembly & test production line (CATPL) parameters Little′s law variability.
ISSN号1476-8186
DOI10.1007/s11633-018-1129-8
英文摘要“Factory physics principles” provided a method to evaluate the performance of a simple production line, whose fundamental parameters are known or given. However, it is difficult to obtain the exact and reasonable parameters in actual manufacturing environment, especially for the complex chipset assembly & test production line (CATPL). Besides, research in this field tends to focus on evaluation and improvement of CATPL without considering performance interval and status with variability level. A developed internal benchmark method is proposed, which established three-parameter method based on the Little′s law. It integrates the variability factors, such as processing time, random failure time, and random repair time, to meet performance evaluation and improvement. A case study in a chipset assembly and test factory for the performance of CATPL is implemented. The results demonstrate the potential of the proposed method to meet performance evaluation and emphasise its relevance for practical applications.
源URL[http://ir.ia.ac.cn/handle/173211/42330]  
专题自动化研究所_学术期刊_International Journal of Automation and Computing
作者单位School of Aeronautics and Astronautics, University of Electronic Science and Technology of China, Chengdu 611731, China
推荐引用方式
GB/T 7714
Chang-Jun Li,Zong-Shi Xie,Xin-Ran Peng,et al. Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability[J]. International Journal of Automation and Computing,2019,16(2):186-198.
APA Chang-Jun Li,Zong-Shi Xie,Xin-Ran Peng,&Bo Li.(2019).Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability.International Journal of Automation and Computing,16(2),186-198.
MLA Chang-Jun Li,et al."Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability".International Journal of Automation and Computing 16.2(2019):186-198.

入库方式: OAI收割

来源:自动化研究所

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