Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability
文献类型:期刊论文
作者 | Chang-Jun Li; Zong-Shi Xie; Xin-Ran Peng; Bo Li |
刊名 | International Journal of Automation and Computing
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出版日期 | 2019 |
卷号 | 16期号:2页码:186-198 |
关键词 | Performance evaluation and improvement chipset assembly & test production line (CATPL) parameters Little′s law variability. |
ISSN号 | 1476-8186 |
DOI | 10.1007/s11633-018-1129-8 |
英文摘要 | “Factory physics principles” provided a method to evaluate the performance of a simple production line, whose fundamental parameters are known or given. However, it is difficult to obtain the exact and reasonable parameters in actual manufacturing environment, especially for the complex chipset assembly & test production line (CATPL). Besides, research in this field tends to focus on evaluation and improvement of CATPL without considering performance interval and status with variability level. A developed internal benchmark method is proposed, which established three-parameter method based on the Little′s law. It integrates the variability factors, such as processing time, random failure time, and random repair time, to meet performance evaluation and improvement. A case study in a chipset assembly and test factory for the performance of CATPL is implemented. The results demonstrate the potential of the proposed method to meet performance evaluation and emphasise its relevance for practical applications. |
源URL | [http://ir.ia.ac.cn/handle/173211/42330] ![]() |
专题 | 自动化研究所_学术期刊_International Journal of Automation and Computing |
作者单位 | School of Aeronautics and Astronautics, University of Electronic Science and Technology of China, Chengdu 611731, China |
推荐引用方式 GB/T 7714 | Chang-Jun Li,Zong-Shi Xie,Xin-Ran Peng,et al. Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability[J]. International Journal of Automation and Computing,2019,16(2):186-198. |
APA | Chang-Jun Li,Zong-Shi Xie,Xin-Ran Peng,&Bo Li.(2019).Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability.International Journal of Automation and Computing,16(2),186-198. |
MLA | Chang-Jun Li,et al."Performance Evaluation and Improvement of Chipset Assembly & Test Production Line Based on Variability".International Journal of Automation and Computing 16.2(2019):186-198. |
入库方式: OAI收割
来源:自动化研究所
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