Artifacts induced in metallic glasses during TEM sample preparation
文献类型：期刊论文
| 作者 | Sun, BB; Wang, YB; Wen, J; Yang, H; Sui, ML; Wang, JQ; Ma, E |
| 刊名 | SCRIPTA MATERIALIA
 |
| 出版日期 | 2005-10-01 |
| 卷号 | 53期号:7页码:805-809 |
| 关键词 | metallic glass TEM sample preparation HRTEM HAADF |
| ISSN号 | 1359-6462 |
| DOI | 10.1016/j.scriptamat.2005.06.007 |
| 通讯作者 | Sui, ML(mlsui@imr.ac.cn) |
| 英文摘要 | The objective of this study is to demonstrate the various artificial features introduced into metallic amorphous alloys by improper TEM sample preparation. Such artifacts are often confused with the intrinsic microstructures when examining metallic glasses under TEM. The electropolishing and ion milling procedures are compared in terms of their merits/drawbacks for avoiding/inducing artifacts in metallic glass samples. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. |
| WOS研究方向 | Science & Technology - Other Topics ; Materials Science ; Metallurgy & Metallurgical Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000231341800004 |
| 出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
| 源URL | [http://ir.imr.ac.cn/handle/321006/83602]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Sui, ML |
| 作者单位 | 1.Chinese Acad Sci, Met Res Inst, SYNL, Shenyang 110016, Peoples R China 2.Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA |
| 推荐引用方式 GB/T 7714 | Sun, BB,Wang, YB,Wen, J,et al. Artifacts induced in metallic glasses during TEM sample preparation[J]. SCRIPTA MATERIALIA,2005,53(7):805-809. |
| APA | Sun, BB.,Wang, YB.,Wen, J.,Yang, H.,Sui, ML.,...&Ma, E.(2005).Artifacts induced in metallic glasses during TEM sample preparation.SCRIPTA MATERIALIA,53(7),805-809. |
| MLA | Sun, BB,et al."Artifacts induced in metallic glasses during TEM sample preparation".SCRIPTA MATERIALIA 53.7(2005):805-809. |
入库方式： OAI收割
来源：金属研究所
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