Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram
文献类型：期刊论文
| 作者 | Du, K; Wang, YM; Lichte, H; Ye, HQ |
| 刊名 | MICRON
 |
| 出版日期 | 2006 |
| 卷号 | 37期号:1页码:67-72 |
| 关键词 | electron holography high-resolution transmission electron microscopy quantitative electron microscopy |
| ISSN号 | 0968-4328 |
| DOI | 10.1016/j.micron.2005.05.007 |
| 通讯作者 | Du, K(kxd44@cwru.edu) |
| 英文摘要 | Precise knowledge of crystal thickness and orientation is critical for reliable interpretation of high-resolution transmission electron micrographs. In this paper, we propose a criterion of S-2(T, u, v), which measures the crystal thickness by intensity matching of the selected-area Fourier transform of experimental holograms with the calculated electron diffraction pattern at a series of trial thicknesses (T) and crystal tilts (it, v). This criterion has been demonstrated successfully for local thickness determination from a simulated high-resolution image of a wedge-shaped YBa2Cu3O7-delta and from an experimental hologram of a Si crystal. (c) 2005 Published by Elsevier Ltd. |
| WOS研究方向 | Microscopy |
| 语种 | 英语 |
| WOS记录号 | WOS:000234032700008 |
| 出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
| 源URL | [http://ir.imr.ac.cn/handle/321006/87702]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Du, K |
| 作者单位 | 1.Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA 2.Dresden Univ Technol, Inst Appl Phys, D-01062 Dresden, Germany 3.Chinese Acad Sci, Met Res Inst, Shenyang 110016, Peoples R China |
| 推荐引用方式 GB/T 7714 | Du, K,Wang, YM,Lichte, H,et al. Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram[J]. MICRON,2006,37(1):67-72. |
| APA | Du, K,Wang, YM,Lichte, H,&Ye, HQ.(2006).Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram.MICRON,37(1),67-72. |
| MLA | Du, K,et al."Measurement of crystal thickness and orientation from selected-area Fourier transformation of a high-resolution electron hologram".MICRON 37.1(2006):67-72. |
入库方式： OAI收割
来源：金属研究所
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