Identification of vacancies in electron irradiated GaSb by coincidence Doppler broadening spectroscopy
文献类型：期刊论文
| 作者 | Shao, Y. D.; Wang, Z.; Dai, Y. Q.; Zhao, Y. W.; Tang, F. Y. |
| 刊名 | MATERIALS LETTERS
 |
| 出版日期 | 2007-02-01 |
| 卷号 | 61期号:4-5页码:1187-1189 |
| 关键词 | GaSb coincidence Doppler broadening electron irradiation defect |
| ISSN号 | 0167-577X |
| DOI | 10.1016/j.matlet.2006.06.088 |
| 通讯作者 | Wang, Z.(wangzhu@positron.whu.edu.cn) |
| 英文摘要 | In this paper we present the results of coincidence Doppler broadening (CDB) measurements and positron lifetime spectroscopy (PLS) on the semiconductor material GaSb. Gallium vacancy with positron lifetime of about 283 ps (V(Ga), (283 ps)) was identified in as-grown sample by CDB technique and PAS technique. For electron irradiated samples with dosages of 10(17) cm(-2) and 10(18) cm(-2), the PAS showed almost the same defectrelated positron lifetime of about 285 ps. CDB experiments indicated that defects in irradiated samples were related to Ga vacancies. (c) 2006 Published by Elsevier B.V. |
| WOS研究方向 | Materials Science ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000243844100065 |
| 出版者 | ELSEVIER SCIENCE BV |
| 源URL | [http://ir.imr.ac.cn/handle/321006/90894]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Wang, Z. |
| 作者单位 | 1.Chinese Acad Sci, Inst Semicond, Ctr Mat Sci, Beijing 100080, Peoples R China 2.Wuhan Univ, Dept Phys, Wuhan 430072, Peoples R China 3.Sichuan Univ, Minist Educ, Key Lab Radiat Phys & Technol, Chengdu, Peoples R China |
| 推荐引用方式 GB/T 7714 | Shao, Y. D.,Wang, Z.,Dai, Y. Q.,et al. Identification of vacancies in electron irradiated GaSb by coincidence Doppler broadening spectroscopy[J]. MATERIALS LETTERS,2007,61(4-5):1187-1189. |
| APA | Shao, Y. D.,Wang, Z.,Dai, Y. Q.,Zhao, Y. W.,&Tang, F. Y..(2007).Identification of vacancies in electron irradiated GaSb by coincidence Doppler broadening spectroscopy.MATERIALS LETTERS,61(4-5),1187-1189. |
| MLA | Shao, Y. D.,et al."Identification of vacancies in electron irradiated GaSb by coincidence Doppler broadening spectroscopy".MATERIALS LETTERS 61.4-5(2007):1187-1189. |
入库方式： OAI收割
来源：金属研究所
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