中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers

文献类型:期刊论文

作者Feigl, L.1; Zheng, S. J.2; Birajdar, B. I.1; Rodriguez, B. J.1; Zhu, Y. L.1,2; Alexe, M.1; Hesse, D.1
刊名JOURNAL OF PHYSICS D-APPLIED PHYSICS
出版日期2009-04-21
卷号42期号:8页码:6
ISSN号0022-3727
DOI10.1088/0022-3727/42/8/085305
通讯作者Feigl, L.(lfeigl@mpi-halle.de)
英文摘要Multilayers consisting of two tetragonal compositions PbZr0.2Ti0.8O3 and PbZr0.4Ti0.6O3 were deposited onto a SrRuO3 electrode grown on a vicinal (100) SrTiO3 substrate. It has been shown by extensive structural investigations comprising transmission electron microscopy in conventional and high resolution mode, reciprocal space mapping and piezoresponse force microscopy that with decreasing layer thickness a transition from a-domains confined to individual layers to a-domains propagating through the whole film takes place. This is caused by the formation of a common strain state of all layers which is responsible for the observed enhancement of the electrical properties. These show a maximum in the product of remanent polarization and dielectric constant at a certain density of interfaces. If the interface density becomes too high the lattice distortion accompanying each interface deteriorates the properties of the multilayer structure.
WOS研究方向Physics
语种英语
WOS记录号WOS:000265248300059
出版者IOP PUBLISHING LTD
源URL[http://ir.imr.ac.cn/handle/321006/96316]  
专题金属研究所_中国科学院金属研究所
通讯作者Feigl, L.
作者单位1.Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
2.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
推荐引用方式
GB/T 7714
Feigl, L.,Zheng, S. J.,Birajdar, B. I.,et al. Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2009,42(8):6.
APA Feigl, L..,Zheng, S. J..,Birajdar, B. I..,Rodriguez, B. J..,Zhu, Y. L..,...&Hesse, D..(2009).Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers.JOURNAL OF PHYSICS D-APPLIED PHYSICS,42(8),6.
MLA Feigl, L.,et al."Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 epitaxial multilayers".JOURNAL OF PHYSICS D-APPLIED PHYSICS 42.8(2009):6.

入库方式: OAI收割

来源:金属研究所

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