X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10
文献类型:期刊论文
作者 | Wang Youdao; Wu Erdong; Wang Sucheng; Li Wuhui |
刊名 | ACTA METALLURGICA SINICA
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出版日期 | 2011-11-11 |
卷号 | 47期号:11页码:1418-1425 |
关键词 | nickel-base single superalloy lattice constant lattice mismatch XRD |
ISSN号 | 0412-1961 |
DOI | 10.3724/SP.J.1037.2011.00307 |
通讯作者 | Wu Erdong(ewu@imr.ac.cn) |
英文摘要 | The lattice constants of the matrix phase gamma and the precipitated phase gamma' in a wafer-like nickel-base single crystal superalloy DD10 were determined by four-axis X-ray diffractometer (XRD). The variations of the lattice constants and lattice mismatches of gamma and gamma' phases in the alloy wafer with different thicknesses, i.e., different interphase restriction conditions were obtained. A critical thickness of the alloy wafer to reach an unstable stress state was defined based on the observed changes of lattice mismatch associated with a transformation of stress state from the 3D bulk state to 2D plane state. The lattice mismatches corresponding to different mismatch stress states were calculated. The lattice constants of the gamma and gamma' phases under a relaxed non-mismatch stress state were evaluated based on certain assumptions. The results showed that after the thickness of the alloy wafer reached the critical value, the lattice constant of the gamma' phase decreased linearly with the decrease of the thickness, whereas that of the gamma phase kept nearly constant, resulting in a linear increase of the absolute value of lattice mismatch. Accompanied with the thinning process, the crystal lattice misorientation and the mosaicity increased, the gamma/gamma' interphase restraint reduced and the interphase stress relaxed, and the measured stress state changed to the plane state. The estimated critical thickness and the lattice constants under non-mismatch stress state could provide references for the design of the components and the measurement of the residual stress in the superalloy. |
WOS研究方向 | Metallurgy & Metallurgical Engineering |
语种 | 英语 |
WOS记录号 | WOS:000299492300010 |
出版者 | SCIENCE PRESS |
源URL | [http://ir.imr.ac.cn/handle/321006/106197] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
通讯作者 | Wu Erdong |
作者单位 | Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China |
推荐引用方式 GB/T 7714 | Wang Youdao,Wu Erdong,Wang Sucheng,et al. X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10[J]. ACTA METALLURGICA SINICA,2011,47(11):1418-1425. |
APA | Wang Youdao,Wu Erdong,Wang Sucheng,&Li Wuhui.(2011).X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10.ACTA METALLURGICA SINICA,47(11),1418-1425. |
MLA | Wang Youdao,et al."X-RAY DIFFRACTION ANALYSIS ON THE THICKNESS EFFECT OF gamma/gamma ' LATTICE MISMATCHE IN NICKEL BASE SINGLE CRYSTAL SUPERALLOY DD10".ACTA METALLURGICA SINICA 47.11(2011):1418-1425. |
入库方式: OAI收割
来源:金属研究所
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