中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM

文献类型:期刊论文

作者Li, DX; Ping, DH; Huang, JY; Yu, YD; Ye, HQ
刊名MICRON
出版日期2000-10-01
卷号31期号:5页码:581-586
关键词nanostructured materials grain boundary defect structure solubility high-resolution electron microscope and field-emission-gun transmission electron microscope
ISSN号0968-4328
通讯作者Li, DX()
英文摘要The microstructure in nanostructured (NS) materials synthesized by different methods have been characterized by electron microscopy methods. NS-Pd was prepared by inert-gas condensation and in situ compacting method (IGCC), NS-alloys by amorphous crystallization method (ACM) and NS-Cu and Cu100-xFex alloy by mechanical alloying (MA) methods. The experimental results have revealed that different preparation techniques lead to different microstructures. The grain boundaries have ordered and disordered structures and high density of defects were frequently detected in NS-materials synthesized by IGCC and MA. For the NS-alloys produced by ACM, however, the structures of GBs are similar to those in coarse-grained materials and the grains have nearly perfect crystal structure. For immiscible systems, a supersaturated Fe-Cu solid solution can be obtained by MA, but it is difficult using IGCC. (C) 2000 Elsevier Science Ltd. All rights reserved.
WOS研究方向Microscopy
语种英语
WOS记录号WOS:000087050100017
出版者PERGAMON-ELSEVIER SCIENCE LTD
源URL[http://ir.imr.ac.cn/handle/321006/110809]  
专题金属研究所_中国科学院金属研究所
通讯作者Li, DX
作者单位Chinese Acad Sci, Met Res Inst, Atom Imaging Solids Lab, Shenyang 110015, Peoples R China
推荐引用方式
GB/T 7714
Li, DX,Ping, DH,Huang, JY,et al. Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM[J]. MICRON,2000,31(5):581-586.
APA Li, DX,Ping, DH,Huang, JY,Yu, YD,&Ye, HQ.(2000).Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM.MICRON,31(5),581-586.
MLA Li, DX,et al."Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM".MICRON 31.5(2000):581-586.

入库方式: OAI收割

来源:金属研究所

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