Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy
文献类型：期刊论文
| 作者 | Ong, HC; Dai, JY; Hung, KC; Chan, YC; Chang, RPH; Ho, ST |
| 刊名 | APPLIED PHYSICS LETTERS
 |
| 出版日期 | 2000-09-04 |
| 卷号 | 77期号:10页码:1484-1486 |
| ISSN号 | 0003-6951 |
| 通讯作者 | Ong, HC() |
| 英文摘要 | The microstructure of polycrystalline ZnO thin films grown on amorphous fused quartz has been studied by transmission electron microscopy and electron energy loss spectroscopy (EELS). The optical functions of the grain and grain boundary of ZnO acquired from EELS are compared to elucidate the mechanism of the formation of self-assemble laser cavities within this material. It is found that the refractive index of the grain boundary is significantly lower than that of the grain due to the lack of excitonic resonance. This large refractive index difference between the grain and grain boundary substantiates the scenario that the formation of laser cavities is caused by the strong optical scattering facilitated in a highly disordered crystalline structure. In addition, our results also imply that the optical characteristics of ZnO have very high tolerance on defects. (C) 2000 American Institute of Physics. [S0003-6951(00)01636-3]. |
| WOS研究方向 | Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000089017200025 |
| 出版者 | AMER INST PHYSICS |
| 源URL | [http://ir.imr.ac.cn/handle/321006/111288]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Ong, HC |
| 作者单位 | 1.City Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China 2.Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA 3.Chinese Acad Sci, Inst Met Res, Beijing 100864, Peoples R China |
| 推荐引用方式 GB/T 7714 | Ong, HC,Dai, JY,Hung, KC,et al. Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy[J]. APPLIED PHYSICS LETTERS,2000,77(10):1484-1486. |
| APA | Ong, HC,Dai, JY,Hung, KC,Chan, YC,Chang, RPH,&Ho, ST.(2000).Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy.APPLIED PHYSICS LETTERS,77(10),1484-1486. |
| MLA | Ong, HC,et al."Electronic structures of polycrystalline ZnO thin films probed by electron energy loss spectroscopy".APPLIED PHYSICS LETTERS 77.10(2000):1484-1486. |
入库方式： OAI收割
来源：金属研究所
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