Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes
文献类型：期刊论文
| 作者 | Chen, Liufang2,3; Li, Yongqiang2,3; Li, Chuanfu2,3; Wang, Hanwen4; Han, Zheng4; Ma, He5; Yuan, Guoliang5; Lin, Lin2,3; Yan, Zhibo2,3; Jiang, Xiangping1 |
| 刊名 | AIP ADVANCES
 |
| 出版日期 | 2019-11-01 |
| 卷号 | 9期号:11页码:6 |
| DOI | 10.1063/1.5123366 |
| 通讯作者 | Liu, Jun-Ming(liujm@nju.edu.cn) |
| 英文摘要 | Two-dimensional (2D) ferroelectrics refer to those ferroelectrics with layered structure and weak interlayer interactions (e.g., van de Waals interlayer coupling). A number of basic physical issues in the framework of ferroelectricity deserve clarifications, and one of them is the size effect regarding the dependence of ferroelectricity on material thickness. In this work, we investigate the ferroelectric domain structures of 2D ferroelectric CuInP2S6 nanoflakes attached on heavily doped Si wafers and polarization switching using the piezoresponse force microscopy. While the domain structure shows highly irregular morphology and 180 degrees domain walls, the statistics on domain size (diameter) W and nanoflake thickness d demonstrates the remarkable thickness dependence of domain size, illustrated by the shrinking domain size from 630 nm to 75 nm with decreasing thickness d from similar to 130 nm to similar to 11 nm. This dependence fits the Landau-Lifshitz-Kittel (LLK) scaling law with the scaling exponent of similar to 0.65, slightly larger than 0.5 for 3D ferroelectrics. It is suggested that the size effect in terms of the LLK scaling law does not show an essential difference between the 2D and 3D ferroelectric systems. (C) 2019 Author(s). |
| 资助项目 | National Key Projects for Basic Researches of China[2016YFA0300101] ; National Key Projects for Basic Researches of China[2015CB654602] ; National Natural Science Foundation of China[51431006] ; National Natural Science Foundation of China[11834002] ; National Natural Science Foundation of China[51721001] |
| WOS研究方向 | Science & Technology - Other Topics ; Materials Science ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000504341600054 |
| 出版者 | AMER INST PHYSICS |
| 资助机构 | National Key Projects for Basic Researches of China ; National Natural Science Foundation of China |
| 源URL | [http://ir.imr.ac.cn/handle/321006/136532]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Liu, Jun-Ming |
| 作者单位 | 1.Jingdezhen Ceram Inst, Sch Mat Sci & Engn, Jingdezhen 333403, Peoples R China 2.Nanjing Univ, Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China 3.Nanjing Univ, Dept Phys, Nanjing 210093, Jiangsu, Peoples R China 4.Chinese Acad Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China 5.Nanjing Univ Sci & Technol, Sch Mat Sci & Engn, Nanjing 210094, Jiangsu, Peoples R China |
| 推荐引用方式 GB/T 7714 | Chen, Liufang,Li, Yongqiang,Li, Chuanfu,et al. Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes[J]. AIP ADVANCES,2019,9(11):6. |
| APA | Chen, Liufang.,Li, Yongqiang.,Li, Chuanfu.,Wang, Hanwen.,Han, Zheng.,...&Liu, Jun-Ming.(2019).Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes.AIP ADVANCES,9(11),6. |
| MLA | Chen, Liufang,et al."Thickness dependence of domain size in 2D ferroelectric CuInP2S6 nanoflakes".AIP ADVANCES 9.11(2019):6. |
入库方式： OAI收割
来源：金属研究所
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