X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films
文献类型：期刊论文
| 作者 | Li YongHua2; Meng FanLing2; Liu ChangSheng1; Zheng WeiTao3; Wang YuMing3 |
| 刊名 | ACTA PHYSICA SINICA
 |
| 出版日期 | 2009 |
| 卷号 | 58期号:4页码:2742-2745 |
| 关键词 | MARTENSITIC-TRANSFORMATION OXIDATION BEHAVIOR PHASE NiTi alloy film X-ray diffraction phase transformation X-ray photoelectron spectroscopy |
| ISSN号 | 1000-3290 |
| 其他题名 | X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films |
| 英文摘要 | The effect of thickness on transformation temperuture of the NiTi thin films has been studied by X-ray diffraction and X-ray photoelectron spectroscopy. Results show that the crystallization temperature for 3 mu m-thick film is higher than that for 18 mu m thick film at the same growth temperature and post annealing. With the substrate temperature increasing, the start temperature (A(s)) of austenite phase is lowered after annealing at 763 K for 1 h. There is an oxide layer (TiO2) on the film surface, which prevents the Ni atom from coming onto the surface. There is an oxide layer of a mixture Ti2O3 with NiO on the film /substrate interface. The oxide layers affect the transformation temperature by changing the Ni atomic content in the interior of the film. |
| 资助项目 | [Harbin Engineering University, China] ; [National Science Foundation for Post-doctoral Scientists of China] ; [Post-doctoral Sustentation Fund of Heilongjiang Province, China] |
| 语种 | 英语 |
| CSCD记录号 | CSCD:3540652 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/147239]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 作者单位 | 1.中国科学院金属研究所 2.Harbin Engn University, Sch Sci, Natl Key Lab Technol AUVs, Harbin 150001, Peoples R China 3.中山大学 |
| 推荐引用方式 GB/T 7714 | Li YongHua,Meng FanLing,Liu ChangSheng,et al. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films[J]. ACTA PHYSICA SINICA,2009,58(4):2742-2745. |
| APA | Li YongHua,Meng FanLing,Liu ChangSheng,Zheng WeiTao,&Wang YuMing.(2009).X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films.ACTA PHYSICA SINICA,58(4),2742-2745. |
| MLA | Li YongHua,et al."X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films".ACTA PHYSICA SINICA 58.4(2009):2742-2745. |
入库方式： OAI收割
来源：金属研究所
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