Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time
文献类型：期刊论文
| 作者 | Gao, Kaiye1,2 |
| 刊名 | IEEE ACCESS
 |
| 出版日期 | 2021 |
| 卷号 | 9页码:38649-38659 |
| 关键词 | Software Fault detection Biological system modeling Software reliability Licenses Software testing Resource management Fault detection optimization reliability simulation software debugging |
| ISSN号 | 2169-3536 |
| DOI | 10.1109/ACCESS.2021.3064296 |
| 英文摘要 | Most traditional software reliability growth models (SRGMs) assume immediate fault correction upon detection and therefore only consider fault detection process (FDP). In order to be more realistic, some researchers have tried to incorporate fault correction process (FCP) and fault introduction process (FIP) into the software reliability models. However, it is still difficult to incorporate into the analytical software reliability models some other factors, such as the different fault detection and correction capabilities of debuggers. In this paper, a simulation approach is proposed to model FDP, FIP, and FCP together considering debuggers with different contributions to fault detection rate, different fault correction rate and different fault introduction rate. Besides, this paper also constructed a cost calculation method to optimize the testing design including debuggers assignment and software release time. Some numerical examples are provided to illustrate the proposed model. The results show that the trends of FDP, FCP and FIP are consistent with the intuition to the practice of software testing, and the optimal testing resources allocation and the optimal release time can be obtained according to the proposed model. |
| 资助项目 | National Natural Science Foundation of China[72001027] ; Beijing Municipal Commission of Education[KM202111232007] |
| WOS研究方向 | Computer Science ; Engineering ; Telecommunications |
| 语种 | 英语 |
| WOS记录号 | WOS:000629723700001 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 源URL | [http://ir.amss.ac.cn/handle/2S8OKBNM/58272]  |
| 专题 | 中国科学院数学与系统科学研究院 |
| 通讯作者 | Gao, Kaiye |
| 作者单位 | 1.Beijing Informat Sci & Technol Univ, Sch Econ & Management, Beijing 100192, Peoples R China 2.Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Gao, Kaiye. Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time[J]. IEEE ACCESS,2021,9:38649-38659. |
| APA | Gao, Kaiye.(2021).Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time.IEEE ACCESS,9,38649-38659. |
| MLA | Gao, Kaiye."Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time".IEEE ACCESS 9(2021):38649-38659. |
入库方式： OAI收割
来源：数学与系统科学研究院
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