Influence of diffuser grain size on the speckle tracking technique
文献类型：期刊论文
| 作者 | Tian, NX; Jiang, H; Li, AG; Liang, DX; Yan, S; Zhang, ZY |
| 刊名 | JOURNAL OF SYNCHROTRON RADIATION
 |
| 出版日期 | 2020 |
| 卷号 | 27页码:146-157 |
| 关键词 | AT-WAVELENGTH METROLOGY PHASE RETRIEVAL |
| ISSN号 | 0909-0495 |
| DOI | 10.1107/S1600577519015200 |
| 文献子类 | 期刊论文 |
| 英文摘要 | The speckle-based X-ray imaging technique (SBT), which includes the three imaging modalities of absorption, phase contrast and dark field, is widely used in many fields. However, the influence of the grain size of the diffuser, the coherence of the X-ray source and the pixel size of the detector on the multi-mode imaging quality of SBT is still woefully unclear. In this paper, the whole SBT process is simulated and the influence of these three factors on image quality is discussed. Based on this discussion, the grain size of the diffuser for SBT applications should be limited by the pixel size of the detector and the coherence length of the X-ray source. According to analysis of the noise signal and correlation map, a suitable grain size is an indispensable condition for high-quality SBT images, because an excessively small or large grain size degrades the resolution of the imaging results and generates false signals. In addition, the power spectral density of the measured raw speckle patterns demonstrates that a smaller grain can better retain high-frequency information from an imaged sample. The simulated and experimental results verify these conclusions. The conclusions of this work will be helpful in designing suitable experimental setups for SBT applications and have the potential to promote the performance of SBT in other applications, such as X-ray optics metrology and coherence measurement. |
| 语种 | 英语 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/32936]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China |
| 推荐引用方式 GB/T 7714 | Tian, NX,Jiang, H,Li, AG,et al. Influence of diffuser grain size on the speckle tracking technique[J]. JOURNAL OF SYNCHROTRON RADIATION,2020,27:146-157. |
| APA | Tian, NX,Jiang, H,Li, AG,Liang, DX,Yan, S,&Zhang, ZY.(2020).Influence of diffuser grain size on the speckle tracking technique.JOURNAL OF SYNCHROTRON RADIATION,27,146-157. |
| MLA | Tian, NX,et al."Influence of diffuser grain size on the speckle tracking technique".JOURNAL OF SYNCHROTRON RADIATION 27(2020):146-157. |
入库方式： OAI收割
来源：上海应用物理研究所
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