Microstructure characterization of IG110 and reactor pebble graphite using synchrotron micro X-ray diffraction 2D maps
文献类型：期刊论文
| 作者 | He, ZT; Zhang, C; Tang, H; Liu, M; Marsden, BJ; Zhou, XT |
| 刊名 | SURFACE AND INTERFACE ANALYSIS
 |
| 出版日期 | 2021 |
| 卷号 | 53期号:1页码:90-99 |
| ISSN号 | 0142-2421 |
| 关键词 | NUCLEAR GRAPHITE FLUORIDE SALT INFILTRATION STRAINS |
| DOI | 10.1002/sia.6876 |
| 文献子类 | 期刊论文 |
| 英文摘要 | Knowledge about the microstructure of nuclear graphite is critical to the understanding of its irradiation behavior in the reactor. Using micro X-ray diffraction (mu XRD) two-dimensional (2D) maps, the crystallite character of IG110 and reactor pebble graphite was characterized at the submillimeter range with a spatial resolution of about 5 mu m. Various structures in the nuclear graphite were identified by comparing the X-ray diffraction peak intensity, position, and full width at half maximum (FWHM) 2D maps. The two-peak feature of the FWHM histograms seen in pebble graphite may be related to the raw coke and natural graphite used as raw materials. With these results, it can be concluded that the mu XRD 2D map is an effective method to characterize the microstructure of nuclear graphite. |
| 语种 | 英语 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/33009]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China 2.Univ Manchester, Sch MACE, Nucl Graphite Res Grp, Manchester M13 9LP, Lancs, England |
| 推荐引用方式 GB/T 7714 | He, ZT,Zhang, C,Tang, H,et al. Microstructure characterization of IG110 and reactor pebble graphite using synchrotron micro X-ray diffraction 2D maps[J]. SURFACE AND INTERFACE ANALYSIS,2021,53(1):90-99. |
| APA | He, ZT,Zhang, C,Tang, H,Liu, M,Marsden, BJ,&Zhou, XT.(2021).Microstructure characterization of IG110 and reactor pebble graphite using synchrotron micro X-ray diffraction 2D maps.SURFACE AND INTERFACE ANALYSIS,53(1),90-99. |
| MLA | He, ZT,et al."Microstructure characterization of IG110 and reactor pebble graphite using synchrotron micro X-ray diffraction 2D maps".SURFACE AND INTERFACE ANALYSIS 53.1(2021):90-99. |
入库方式： OAI收割
来源：上海应用物理研究所
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