Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy
文献类型：期刊论文
| 作者 | Deng, SH; Wang, P; Zhang, YL; Zhou, HL; Yang, JZ; Liu, MP |
| 刊名 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
 |
| 出版日期 | 2020 |
| 卷号 | 37期号:1页码:84-88 |
| ISSN号 | 1084-7529 |
| 关键词 | FLUORESCENCE MICROSCOPY DIFFRACTION DEEP |
| DOI | 10.1364/JOSAA.37.000084 |
| 文献子类 | 期刊论文 |
| 英文摘要 | We report on the generation of a hollow Bessel beam with a hole along the direction of propagation by using an easy-to-implement phase mask and investigate its effectiveness to reduce the out-of-focus background in light-sheet fluorescence microscopy (LSFM) with scanned Bessel beams by subtraction imaging. Overlaying pi-phase retardation between the two equal parts of the Bessel beam across the entrance pupil of the objective lens, a hollow Bessel beam with zero intensity at the focal plane can be achieved. By optimizing the numerical aperture of the annular mask applied in the hollow Bessel beam, matched distributions of the ring system between the hollow Bessel beam and the conventional Bessel beam are achieved. By subtraction between the two LSFM images, the out-of-focus blur caused by the ring system of the Bessel beam can be significantly reduced. Comparison with conventional Bessel LSFM images exhibits a better sectioning capability and higher contrast. (C) 2019 Optical Society of America |
| 语种 | 英语 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/33171]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Appl Phys, Div Phys Biol, Shanghai 201800, Peoples R China 2.Nanchang Univ, Sch Informat Engn, Nanchang 330031, Jiangxi, Peoples R China |
| 推荐引用方式 GB/T 7714 | Deng, SH,Wang, P,Zhang, YL,et al. Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,2020,37(1):84-88. |
| APA | Deng, SH,Wang, P,Zhang, YL,Zhou, HL,Yang, JZ,&Liu, MP.(2020).Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy.JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION,37(1),84-88. |
| MLA | Deng, SH,et al."Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy".JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION 37.1(2020):84-88. |
入库方式： OAI收割
来源：上海应用物理研究所
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