CHARACTERIZATION OF ELECTRONIC STRUCTURES AT ORGANIC-2D MATERIALS INTERFACES WITH ADVANCED SYNCHROTRON-BASED SOFT X-RAY SPECTROSCOPY
文献类型：期刊论文
| 作者 | Cao, Liang1; Qi, Dong-Chen2,3 |
| 刊名 | SURFACE REVIEW AND LETTERS
 |
| 出版日期 | 2021-08-01 |
| 卷号 | 28 |
| 关键词 | Synchrotron radiation photoemission spectroscopy energy level alignment NEXAFS molecular orientation core-hole clock spectroscopy ultrafast charge transfer dynamics XMCD spin configuration |
| ISSN号 | 0218-625X |
| DOI | 10.1142/S0218625X21400096 |
| 通讯作者 | Cao, Liang(lcao@hmfl.ac.cn) ; Qi, Dong-Chen(dongchen.qi@qut.edu.au) |
| 英文摘要 | The discovery of two-dimensional (2D) materials with single or a few-atom-thick layers has presented unprecedented opportunities to study, control and harness the properties of van der Waals (vdW) materials at their 2D limit. It also offers a platform that allows the arbitrary creation of heterostructures in a materials-by-design approach with properties tailored by the constituting components. Combining organic molecules with 2D materials to form hybrid heterointerfaces has recently emerged as a facile and versatile approach to engineer the electronic, optical, magnetic and chemical properties of 2D materials for new or optimized device applications. Underpinning the development of organic-2D materials heterostructures is the ability to interrogate the interfacial electronic structures and properties at multiple dimensions. This review provides a timely update on the application of synchrotron-based soft X-ray spectroscopies (SR-SXS) in the characterization of organic-2D materials interfaces. By harnessing the unparalleled high energy resolution, tunable energy, high brilliance and tunable polarization inherent to synchrotron radiation, electronic structures, charge transfer dynamics, molecular orientations and spin configurations at the hybrid interfaces can be examined, which helps us to formularize a coherent understanding of the organic-2D materials interfaces that will guide the design of new hybrid vdW structures and devices. We also offer our perspective on the future application of SR-SXS in the exploration of organic-2D materials heterostructures. |
| WOS关键词 | CHARGE-TRANSFER DYNAMICS ; MAGNETIC CIRCULAR-DICHROISM ; COVALENT FUNCTIONALIZATION ; MOLECULAR-ORIENTATION ; MOLYBDENUM-DISULFIDE ; ZINC PHTHALOCYANINE ; BLACK PHOSPHORUS ; GRAPHENE ; TRANSITION ; SURFACE |
| 资助项目 | National Key Research and Development Program of China[2017YFA0402900] ; National Natural Science Foundation of China[12074385] ; High Magnetic Field Laboratory of Anhui Province ; Australian Research Council[FT160100207] ; Queensland University of Technology (QUT) through the Centre for Materials Science |
| WOS研究方向 | Chemistry ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000687373600002 |
| 出版者 | WORLD SCIENTIFIC PUBL CO PTE LTD |
| 资助机构 | National Key Research and Development Program of China ; National Natural Science Foundation of China ; High Magnetic Field Laboratory of Anhui Province ; Australian Research Council ; Queensland University of Technology (QUT) through the Centre for Materials Science |
| 源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/125237]  |
| 专题 | 中国科学院合肥物质科学研究院 |
| 通讯作者 | Cao, Liang; Qi, Dong-Chen |
| 作者单位 | 1.Chinese Acad Sci, Anhui Key Lab Condensed Matter Phys Extreme Condi, High Magnet Field Lab, HFIPS, Hefei 230031, Anhui, Peoples R China 2.Queensland Univ Technol, Sch Chem & Phys, Brisbane, Qld 4001, Australia 3.Queensland Univ Technol, Ctr Mat Sci, Brisbane, Qld 4001, Australia |
| 推荐引用方式 GB/T 7714 | Cao, Liang,Qi, Dong-Chen. CHARACTERIZATION OF ELECTRONIC STRUCTURES AT ORGANIC-2D MATERIALS INTERFACES WITH ADVANCED SYNCHROTRON-BASED SOFT X-RAY SPECTROSCOPY[J]. SURFACE REVIEW AND LETTERS,2021,28. |
| APA | Cao, Liang,&Qi, Dong-Chen.(2021).CHARACTERIZATION OF ELECTRONIC STRUCTURES AT ORGANIC-2D MATERIALS INTERFACES WITH ADVANCED SYNCHROTRON-BASED SOFT X-RAY SPECTROSCOPY.SURFACE REVIEW AND LETTERS,28. |
| MLA | Cao, Liang,et al."CHARACTERIZATION OF ELECTRONIC STRUCTURES AT ORGANIC-2D MATERIALS INTERFACES WITH ADVANCED SYNCHROTRON-BASED SOFT X-RAY SPECTROSCOPY".SURFACE REVIEW AND LETTERS 28(2021). |
入库方式： OAI收割
来源：合肥物质科学研究院
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