A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density
文献类型：期刊论文
| 作者 | Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen |
| 刊名 | ELECTRONICS
 |
| 出版日期 | 2020 |
| 卷号 | 9期号:11页码:1900 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30043]  |
| 专题 | 半导体研究所_光电子研究发展中心 |
| 推荐引用方式 GB/T 7714 | Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen;. A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density[J]. ELECTRONICS,2020,9(11):1900. |
| APA | Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen;.(2020).A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density.ELECTRONICS,9(11),1900. |
| MLA | Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen;."A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density".ELECTRONICS 9.11(2020):1900. |
入库方式： OAI收割
来源：半导体研究所
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