The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates
文献类型：期刊论文
| 作者 | Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao |
| 刊名 | NANOSCALE RESEARCH LETTERS
 |
| 出版日期 | 2020 |
| 卷号 | 15期号:1页码:43 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30520]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao. The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates[J]. NANOSCALE RESEARCH LETTERS,2020,15(1):43. |
| APA | Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao.(2020).The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates.NANOSCALE RESEARCH LETTERS,15(1),43. |
| MLA | Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao."The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates".NANOSCALE RESEARCH LETTERS 15.1(2020):43. |
入库方式： OAI收割
来源：半导体研究所
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