Single-Photon Emission from Point Defects in Aluminum Nitride Films
文献类型：期刊论文
| 作者 | Yongzhou Xue; Hui Wang; Nan Xie; Qian Yang; Fujun Xu; Bo Shen; Jun-jie Shi; Desheng Jiang; Xiuming Dou; Tongjun Yu; Bao-quan Sun |
| 刊名 | JOURNAL OF PHYSICAL CHEMISTRY LETTERS
 |
| 出版日期 | 2020 |
| 卷号 | 11期号:7页码:2689-2694 |
| 公开日期 | 2020 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30420]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Yongzhou Xue; Hui Wang; Nan Xie; Qian Yang; Fujun Xu; Bo Shen; Jun-jie Shi; Desheng Jiang; Xiuming Dou; Tongjun Yu; Bao-quan Sun. Single-Photon Emission from Point Defects in Aluminum Nitride Films[J]. JOURNAL OF PHYSICAL CHEMISTRY LETTERS,2020,11(7):2689-2694. |
| APA | Yongzhou Xue; Hui Wang; Nan Xie; Qian Yang; Fujun Xu; Bo Shen; Jun-jie Shi; Desheng Jiang; Xiuming Dou; Tongjun Yu; Bao-quan Sun.(2020).Single-Photon Emission from Point Defects in Aluminum Nitride Films.JOURNAL OF PHYSICAL CHEMISTRY LETTERS,11(7),2689-2694. |
| MLA | Yongzhou Xue; Hui Wang; Nan Xie; Qian Yang; Fujun Xu; Bo Shen; Jun-jie Shi; Desheng Jiang; Xiuming Dou; Tongjun Yu; Bao-quan Sun."Single-Photon Emission from Point Defects in Aluminum Nitride Films".JOURNAL OF PHYSICAL CHEMISTRY LETTERS 11.7(2020):2689-2694. |
入库方式： OAI收割
来源：半导体研究所
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