A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD
文献类型：期刊论文
| 作者 | Zhu, Mingzhu1,2; Yu, Junzhi3 ; Gao, Zhang4; He, Bingwei1; Liu, Jiantao1
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| 刊名 | IEEE SIGNAL PROCESSING LETTERS
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| 出版日期 | 2021 |
| 卷号 | 28页码:1065-1069 |
| 关键词 | Image edge detection Measurement Robustness Linear regression Complexity theory Noise measurement Mutual information Regression robustness multi-modal corres-pondence edge consistency singular value decomposition |
| ISSN号 | 1070-9908 |
| DOI | 10.1109/LSP.2021.3080196 |
| 通讯作者 | Yu, Junzhi(junzhi.yu@ia.ac.cn) |
| 英文摘要 | In this paper, we propose a novel edge consistency metric for multi-modal correspondence. It is based on a novel observation on image truncated SVD (singular value decomposition) termed regression robustness, which describes the fact that, a good approximation from image truncated SVD can be inherited even if the eigen-images change due to expansion and channel-dependent offsets. Compared to state-of-the-arts, multi-modal edge consistency metric can simultaneously handle multiple images with complex modality changes, including local variation, gradient reverse, intensity order change, and texture loss. Its complexity is almost linear to pixel number. Remarkable accuracies have been achieved in experiments. |
| WOS关键词 | IMAGE REGISTRATION ; MUTUAL-INFORMATION |
| 资助项目 | National Key Research and Development Program of China[2020YFB1312800] ; Opening Project of Guangdong Provincial Key Lab of Robotics and Intelligent System |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000659546200003 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 资助机构 | National Key Research and Development Program of China ; Opening Project of Guangdong Provincial Key Lab of Robotics and Intelligent System |
| 源URL | [http://ir.ia.ac.cn/handle/173211/45307]  |
| 专题 | 自动化研究所_复杂系统管理与控制国家重点实验室 |
| 通讯作者 | Yu, Junzhi |
| 作者单位 | 1.Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China 2.Chinese Acad Sci, Shenzhen Inst Adv Technol, Guangdong Prov Key Lab Robot & Intelligent Syst, Shenzhen 518055, Peoples R China 3.Peking Univ, State Key Lab Turbulence & Complex Syst, Dept Adv Mfg & Robot, BIC ESAT,Coll Engn, Beijing 100871, Peoples R China 4.Chinese Acad Sci, Inst Automat, State Key Lab Management & Control Complex Syst, Beijing 100190, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhu, Mingzhu,Yu, Junzhi,Gao, Zhang,et al. A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD[J]. IEEE SIGNAL PROCESSING LETTERS,2021,28:1065-1069. |
| APA | Zhu, Mingzhu,Yu, Junzhi,Gao, Zhang,He, Bingwei,&Liu, Jiantao.(2021).A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD.IEEE SIGNAL PROCESSING LETTERS,28,1065-1069. |
| MLA | Zhu, Mingzhu,et al."A Multi-Modal Edge Consistency Metric Based on Regression Robustness of Truncated SVD".IEEE SIGNAL PROCESSING LETTERS 28(2021):1065-1069. |
入库方式： OAI收割
来源：自动化研究所
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