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Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy

文献类型：期刊论文

作者Wang, W. X.2; Ling, Z. X.1,2; Zhang, C.1,2; Jia, Z. Q.2; Wang, X. Y.5; Wu, Q.4; Yuan, W. M.1,2; Zhang, S. N.2,3
刊名JOURNAL OF INSTRUMENTATION
出版日期2019-02-01
卷号14页码:10
关键词Imaging spectroscopy Solid state detectors X-ray detectors X-ray detectors and telescopes
ISSN号1748-0221
DOI10.1088/1748-0221/14/02/P02025
英文摘要In recent years, significant progress has been made on Complementary Metal Oxide Semiconductor (CMOS) devices, which have been proposed as X-ray imaging spectroscopes for future space astronomy missions. We tested a newly developed backside-illuminated scientific CMOS (BSI sCMOS) device, which is treated as a soft X-ray imaging spectroscopy. This BSI sCMOS has an array of 2048 x 2048 pixels with a pixel size of 11 mu m and an epitaxial thickness of 3.6 mu m. It is an active pixel sensor with fast readout, low power consumption and low readout noise. We investigated the performance of this BSI sCMOS as a soft X-ray detector. The energy resolution reaches 192 eV at 5.9 keV near room temperature. When the detector is cooled down to -20 degrees C, the results show the readout noise to be approximately 1.5 e(-), the dark current to be 159 e(-)/pixel/s, and the energy resolution to be 187 eV (3.2%) at 5.9 keV. Meanwhile, the soft X-rays down to the carbon line (277 eV) can be clearly identified.
资助项目National Natural Science Foundation of China[11703050] ; National Natural Science Foundation of China[11427804] ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Youth Innovation Promotion Association CAS
WOS研究方向Instruments & Instrumentation
语种英语
WOS记录号WOS:000460766400020
出版者IOP PUBLISHING LTD
资助机构National Natural Science Foundation of China ; National Natural Science Foundation of China ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Youth Innovation Promotion Association CAS ; Youth Innovation Promotion Association CAS ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Youth Innovation Promotion Association CAS ; Youth Innovation Promotion Association CAS ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Youth Innovation Promotion Association CAS ; Youth Innovation Promotion Association CAS ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Key Laboratory of Space Astronomy and Technology, National Astronomical Observatories of the Chinese Academy of Sciences ; Youth Innovation Promotion Association CAS ; Youth Innovation Promotion Association CAS
源URL[http://ir.bao.ac.cn/handle/114a11/25321]  
专题中国科学院国家天文台
通讯作者Ling, Z. X.
作者单位1.Univ Chinese Acad Sci, Sch Astron & Space Sci, Beijing 100049, Peoples R China
2.Chinese Acad Sci, Natl Astron Observ, Beijing 100101, Peoples R China
3.Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China
4.Beijing Weihua High Tech Co Ltd, Beijing 100086, Peoples R China
5.Gpixel Inc, Changchun 130033, Jilin, Peoples R China
推荐引用方式
GB/T 7714		 Wang, W. X.,Ling, Z. X.,Zhang, C.,et al. Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy[J]. JOURNAL OF INSTRUMENTATION,2019,14:10.
APA Wang, W. X..,Ling, Z. X..,Zhang, C..,Jia, Z. Q..,Wang, X. Y..,...&Zhang, S. N..(2019).Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy.JOURNAL OF INSTRUMENTATION,14,10.
MLA Wang, W. X.,et al."Characterization of a BSI sCMOS for soft X-ray imaging spectroscopy".JOURNAL OF INSTRUMENTATION 14(2019):10.

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来源：国家天文台

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