中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The Influence of Anode Trench Geometries on Electrical Properties of AlGaN/GaN Schottky Barrier Diodes

文献类型:期刊论文

作者Xiuxia Yang;  Zhe Cheng;  Zhiguo Yu;  Lifang Jia;  Lian Zhang;  Yun Zhang
刊名ELECTRONICS
出版日期2020
卷号9期号:2页码:282
源URL[http://ir.semi.ac.cn/handle/172111/30539]  
专题半导体研究所_固态光电信息技术实验室
推荐引用方式
GB/T 7714
Xiuxia Yang;Zhe Cheng;Zhiguo Yu;Lifang Jia;Lian Zhang;Yun Zhang;. The Influence of Anode Trench Geometries on Electrical Properties of AlGaN/GaN Schottky Barrier Diodes[J]. ELECTRONICS,2020,9(2):282.
APA Xiuxia Yang;Zhe Cheng;Zhiguo Yu;Lifang Jia;Lian Zhang;Yun Zhang;.(2020).The Influence of Anode Trench Geometries on Electrical Properties of AlGaN/GaN Schottky Barrier Diodes.ELECTRONICS,9(2),282.
MLA Xiuxia Yang;Zhe Cheng;Zhiguo Yu;Lifang Jia;Lian Zhang;Yun Zhang;."The Influence of Anode Trench Geometries on Electrical Properties of AlGaN/GaN Schottky Barrier Diodes".ELECTRONICS 9.2(2020):282.

入库方式: OAI收割

来源:半导体研究所

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