中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Improved Active Disturbance Rejection Control of optoelectronic stabilized platform Based on Reduced-order Extended State Observer

文献类型:会议论文

作者Gao, Peng1,2,3; Su, Xiuqin3; Wang, Weifeng3; Zhang, Wenbo1,2,3
出版日期2021-10-15
会议日期2021-10-15
会议地点Xi'an, China
关键词active disturbance rejection control optoelectronic stabilized platform extended state observe Variable Speed Integral optical axis
DOI10.1109/ITNEC52019.2021.9587065
页码889-894
英文摘要

In order to improve the anti-disturbance ability and dynamic response characteristics of the optoelectronic stabilized platform, an improved linear active disturbance rejection control (ADRC) algorithm is proposed. The algorithm adopts reduced-order extended state observer (RESO) to realize fast tracking and estimating disturbances, which improves the restraining rapidity of disturbances. The Variable Speed Integral Proportional Integral (VSIPI) algorithm is introduced to solve the contradiction between transition speed and response overshoot, so as to obtain faster response speed and lower overshoot. The simulation results show that the algorithm has stronger anti-interference ability and robustness than the traditional PI. © 2021 IEEE.

产权排序1
会议录IEEE Information Technology, Networking, Electronic and Automation Control Conference, ITNEC 2021
会议录出版者Institute of Electrical and Electronics Engineers Inc.
语种英语
ISBN号9781665415989
源URL[http://ir.opt.ac.cn/handle/181661/95547]  
专题西安光学精密机械研究所_光电测量技术实验室
通讯作者Gao, Peng
作者单位1.University of Chinese Academy of Sciences, Beijing; 100049, China
2.School of Electronic and Information Engineering, Xi'An Jiaotong University, Xi'an; 710049, China;
3.Xi'An Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; 710119, China;
推荐引用方式
GB/T 7714
Gao, Peng,Su, Xiuqin,Wang, Weifeng,et al. Improved Active Disturbance Rejection Control of optoelectronic stabilized platform Based on Reduced-order Extended State Observer[C]. 见:. Xi'an, China. 2021-10-15.

入库方式: OAI收割

来源:西安光学精密机械研究所

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