中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Opposite target measurement based on infrared radiation characteristic system

文献类型:期刊论文

作者Qiao, Tie-Ying; Cai, Li-Hua; Li, Ning; Li, Zhou; Li, Cheng-Hao
刊名Chinese Optics
出版日期2018
卷号11期号:5页码:804-811
关键词Infrared radiation Luminance Mean square error Stealth technology
ISSN号20951531
DOI10.3788/CO.20181105.0804
英文摘要The ground-based infrared theodolite is one of the most important means of measuring infrared data of military and scientific targets in space. With the rapid development of modern weapons technology in stealth, the measurement of surface target is becoming more and more important and the radiation brightness is a key indicator of surface type infrared combat. Therefore, it is of great significance to study area analysis method and radiance calculation method to test the stealth performance of the aviation target and to develop surface type infrared false target. In this paper, a simple and reliable method for extracting surface targets is proposed. By this method, radiation measurement is performed on a 600 mm aperture infrared theodolite. The measured data is compared with the standard brightness value after atmospheric correction. The experimental results show that the maximum error of the radiance inversion is 11.38% and the root mean square error is 7.36%. The experimental results show the effectiveness and reliability of the measurement method. 2018, China Science Publishing & Media LTD. All right reserved.
源URL[http://ir.ciomp.ac.cn/handle/181722/60745]  
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
Qiao, Tie-Ying,Cai, Li-Hua,Li, Ning,et al. Opposite target measurement based on infrared radiation characteristic system[J]. Chinese Optics,2018,11(5):804-811.
APA Qiao, Tie-Ying,Cai, Li-Hua,Li, Ning,Li, Zhou,&Li, Cheng-Hao.(2018).Opposite target measurement based on infrared radiation characteristic system.Chinese Optics,11(5),804-811.
MLA Qiao, Tie-Ying,et al."Opposite target measurement based on infrared radiation characteristic system".Chinese Optics 11.5(2018):804-811.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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