Reversible manipulation of lattice defects in single-crystal SnO2 microrod by applying mechanical stress and voltage
文献类型：期刊论文
| 作者 | Sakurai, Makoto; Liu, Kewei ; Aono, Masakazu
|
| 刊名 | Journal of Applied Physics
 |
| 出版日期 | 2018 |
| 卷号 | 125期号:8 |
| 关键词 | Semiconducting tin compounds Defects Single crystals Transmission electron microscopy |
| ISSN号 | 218979 |
| DOI | 10.1063/1.5053837 |
| 英文摘要 | We report a reversible transition between semiconducting and insulating states in a single-crystal SnO2 microrod device through creation and healing of lattice defects by applying mechanical stress and voltage. The process of creating lattice defects by using mechanical stress is investigated using transmission electron microscope and photoluminescence observations. The results reveal the presence of slip planes and non-volatile lattice defects. The healing process is analyzed through the dynamic response of the current to the pulse voltage applied to the ends of the microrod. It is found that there are fast and slow healing processes. The fast process is due to field-induced reduction of the trapping potential barrier, and the slow one is due to Joule heating. The reversible and nonlinear nature of the defect manipulation will open new avenues of innovation different from those of conventional technology, especially for the mechanical design of touch interfaces. 2018 Author(s). |
| 源URL | [http://ir.ciomp.ac.cn/handle/181722/60789]  |
| 专题 | 中国科学院长春光学精密机械与物理研究所 |
| 推荐引用方式 GB/T 7714 | Sakurai, Makoto,Liu, Kewei,Aono, Masakazu. Reversible manipulation of lattice defects in single-crystal SnO2 microrod by applying mechanical stress and voltage[J]. Journal of Applied Physics,2018,125(8). |
| APA | Sakurai, Makoto,Liu, Kewei,&Aono, Masakazu.(2018).Reversible manipulation of lattice defects in single-crystal SnO2 microrod by applying mechanical stress and voltage.Journal of Applied Physics,125(8). |
| MLA | Sakurai, Makoto,et al."Reversible manipulation of lattice defects in single-crystal SnO2 microrod by applying mechanical stress and voltage".Journal of Applied Physics 125.8(2018). |
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