中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
High-accuracy measurement of the focal length and distortion of optical systems based on interferometry

文献类型:期刊论文

作者Yang, G. Q.; Miao, L.; Zhang, X.; Sun, C.; Qiao, Y. F.
刊名Applied Optics
出版日期2018
卷号57期号:18页码:5217-5223
关键词talbot interferometry Optics
ISSN号1559-128X
DOI10.1364/ao.57.005217
英文摘要A figure measuring interferometer (FMI) method is proposed for high-accuracy measurement of the focal length and distortion of optical systems simultaneously. FMI uses the Zernike coefficients of interference fringe to identify the image point position precisely, and then measures the distance between the image points under the different fields to determine the image height. The field of view can also be accurately obtained by a precise rotating platform. Linear fitting between the field of view and the image height is used to calculate the focal length and distortion. The experimental results indicate that FMI has a relative expanded standard uncertainty of less than 0.01% for focal length and 0.02% for distortion. In brief, the proposed method is feasible for measurement of the focal length and distortion with high accuracy, promising further industrial applications. (C) 2018 Optical Society of America
源URL[http://ir.ciomp.ac.cn/handle/181722/61013]  
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
Yang, G. Q.,Miao, L.,Zhang, X.,et al. High-accuracy measurement of the focal length and distortion of optical systems based on interferometry[J]. Applied Optics,2018,57(18):5217-5223.
APA Yang, G. Q.,Miao, L.,Zhang, X.,Sun, C.,&Qiao, Y. F..(2018).High-accuracy measurement of the focal length and distortion of optical systems based on interferometry.Applied Optics,57(18),5217-5223.
MLA Yang, G. Q.,et al."High-accuracy measurement of the focal length and distortion of optical systems based on interferometry".Applied Optics 57.18(2018):5217-5223.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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