A novel method to characterize the angular resolution of soft X-ray grazing incidence telescope
文献类型：期刊论文
| 作者 | Y.-c.Zhang; P.Liu; X.-g.Wang; L.-p.He; B.Chen |
| 刊名 | Optoelectronics Letters
 |
| 出版日期 | 2019 |
| 卷号 | 15期号:2页码:98-103 |
| 关键词 | X rays,Diffraction,Optical transfer function,Surface scattering,Telescopes |
| ISSN号 | 16731905 |
| DOI | 10.1007/s11801-019-8124-3 |
| 英文摘要 | In this paper, a novel method is proposed to characterize the operation-waveband angular resolution of the soft X-ray grazing incidence telescope.According to the method, the first is to restore the "geometric image" by removing the aperture diffraction effect from the resolution testing target image measured at visible waveband.The second is to calculate the operation-waveband resolution testing target image by the convolution of "geometric image", diffraction point spread function and surface scattering point spread function.Finally, the operation-waveband (4.47 nm) angular resolution of 9.72 is calculated according to the operation-waveband resolution testing target image on axis.The method does not need to be performed in vacuum and to place the source away from the solar X-ray grazing incidence telescope, which greatly reduces the testing cost and improves the efficiency for the development of the soft X-ray grazing incidence telescope.2019, Tianjin University of Technology and Springer-Verlag GmbH Germany, part of Springer Nature. |
| URL标识 | 查看原文 |
| 源URL | [http://ir.ciomp.ac.cn/handle/181722/62769]  |
| 专题 | 中国科学院长春光学精密机械与物理研究所 |
| 推荐引用方式 GB/T 7714 | Y.-c.Zhang,P.Liu,X.-g.Wang,et al. A novel method to characterize the angular resolution of soft X-ray grazing incidence telescope[J]. Optoelectronics Letters,2019,15(2):98-103. |
| APA | Y.-c.Zhang,P.Liu,X.-g.Wang,L.-p.He,&B.Chen.(2019).A novel method to characterize the angular resolution of soft X-ray grazing incidence telescope.Optoelectronics Letters,15(2),98-103. |
| MLA | Y.-c.Zhang,et al."A novel method to characterize the angular resolution of soft X-ray grazing incidence telescope".Optoelectronics Letters 15.2(2019):98-103. |
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