Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips
文献类型:期刊论文
作者 | Y.Xu; Y.H.Wu; J.F.Wu; M.B.Chi |
刊名 | Applied Spectroscopy
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出版日期 | 2019 |
卷号 | 73期号:1页码:40-46 |
关键词 | Ultraviolet-visible,UV-Vis spectrophotometry,multiwavelength linear,regression,MLR,centrifugal microfluidic chip,surface roughness,scattering,Instruments & Instrumentation,Spectroscopy |
ISSN号 | 0003-7028 |
DOI | 10.1177/0003702818798044 |
英文摘要 | An ultraviolet visible (UV-Vis) spectrophotometric and multiwavelength linear regression (MLR) method was developed for eliminating the influence of the surface quality of centrifugal microfluidic chips on the accuracy of their absorbance detection. The regression model is based on scalar scattering theory. The method was validated with cuvettes with different surface quality and Orange G (orange gelb) dye. The coefficients of variation (CVs) of the predicted solution concentration ratios in different cuvettes were < 1%, and the relative errors were < 1.5%. The model was shown to have higher accuracy and precision than that of traditional methods. |
语种 | 英语 |
源URL | [http://ir.ciomp.ac.cn/handle/181722/62908] ![]() |
专题 | 中国科学院长春光学精密机械与物理研究所 |
推荐引用方式 GB/T 7714 | Y.Xu,Y.H.Wu,J.F.Wu,et al. Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips[J]. Applied Spectroscopy,2019,73(1):40-46. |
APA | Y.Xu,Y.H.Wu,J.F.Wu,&M.B.Chi.(2019).Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips.Applied Spectroscopy,73(1),40-46. |
MLA | Y.Xu,et al."Multiwavelength Regression Algorithm for Eliminating Chamber Surface Effects of Microfluidic Chips".Applied Spectroscopy 73.1(2019):40-46. |
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