中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Modified band alignment at multilayer MoS2/Al2O3 heterojunctions by nitridation treatment

文献类型:期刊论文

作者X.K.Liu; K.L.Li; X.J.Sun; Z.M.Shi; Z.H.Huang; Z.W.Li; L.Min
刊名Journal of Alloys and Compounds
出版日期2019
卷号793页码:599-603
关键词Multilayer MoS2,Al2O3 surface,NH3 treatment,Band alignment,field-effect transistor,layer mos2,Chemistry,Materials Science,Metallurgy & Metallurgical Engineering
ISSN号0925-8388
DOI10.1016/j.jallcom.2019.04.227
英文摘要Interface engineering plays a decisive role in the two-dimensional material/high-kappa oxide heterojunction-based devices. In this work, the effects of NH3 plasma interface treatment on the energy band alignment at multilayer MoS2/Al2O3 heterostructures were explored using x-ray photoelectron spectroscopy. A type-I band alignment was formed with valence band offset (VBO) and conduction band offset (CBO) about 3.67 eV and 2.33 eV, respectively. Significantly, the CBO was enlarged by about 0.45 eV after the plasma treatment, which was mainly attributed to the increased separation between the Al 2p core-level energy and valence band maximum. This interesting finding provides a significant guidance for the band adjustment at the interface and further applications of multilayer MoS2 in electronic devices. (C) 2019 Elsevier B.V. All rights reserved.
语种英语
源URL[http://ir.ciomp.ac.cn/handle/181722/63177]  
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
X.K.Liu,K.L.Li,X.J.Sun,et al. Modified band alignment at multilayer MoS2/Al2O3 heterojunctions by nitridation treatment[J]. Journal of Alloys and Compounds,2019,793:599-603.
APA X.K.Liu.,K.L.Li.,X.J.Sun.,Z.M.Shi.,Z.H.Huang.,...&L.Min.(2019).Modified band alignment at multilayer MoS2/Al2O3 heterojunctions by nitridation treatment.Journal of Alloys and Compounds,793,599-603.
MLA X.K.Liu,et al."Modified band alignment at multilayer MoS2/Al2O3 heterojunctions by nitridation treatment".Journal of Alloys and Compounds 793(2019):599-603.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。