Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits
文献类型：期刊论文
| 作者 | Wang, Shu1; Cai, Chang1,2; Ning, Bingxu3; He, Ze2; Huang, Zhiqin3; Xu, Lingyan3; Shen, Mingjie3; Xu, Liewei3; Chen, Gengsheng1 |
| 刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
 |
| 出版日期 | 2021-10-01 |
| 卷号 | 1012页码:11 |
| ISSN号 | 0168-9002 |
| 关键词 | SerDes SRAM-based FPGA Single Event Upset Single Event Functional Interrupt |
| DOI | 10.1016/j.nima.2021.165618 |
| 通讯作者 | Chen, Gengsheng(gschen@fudan.edu.cn) |
| 英文摘要 | This paper characterizes the Single Event Effect (SEE) sensitivities of the Serializer/Deserializer (SerDes) module on the advanced 28 nm Xilinx Kintex-7 Field Programmable Gate Array (FPGA). A systematical SEE measurement method is proposed and implemented to evaluate the SEE sensitivity of the SerDes circuits. In our experiments, an extremely low Single Event Upset (SEU) Linear Energy Transfer (LET) threshold of the SerDes circuits was investigated, and both the recoverable and unrecoverable Single Event Functional Interrupts (SEFIs) were clearly distinguished and classified. In the experiments, it was found that the SEUs and recoverable SEFIs of the TX and RX in the same channel were closely related due to their shared clock and control circuits. Based on this detailed survey, a further discussion of the mechanisms of the SEU, recoverable SEFI, and unrecoverable SEFI is also provided. The SEE sensitivity of the high-speed SerDes circuits presented in this paper will promote the effective utilization of error mitigation strategies in order to control the risks of applications in radiation environments. |
| WOS关键词 | SRAM-BASED FPGA ; RADIATION ; TRANSCEIVERS ; DESIGN |
| 资助项目 | Fund of the China Institute of Atomic Energy[KFZC2019-040304] ; Fund of the China Institute of Atomic Energy[KFZC2020010501] ; State Key Laboratory of ASIC and Systems[2020KF009] |
| WOS研究方向 | Instruments & Instrumentation ; Nuclear Science & Technology ; Physics |
| 语种 | 英语 |
| 出版者 | ELSEVIER |
| WOS记录号 | WOS:000684989700003 |
| 资助机构 | Fund of the China Institute of Atomic Energy ; State Key Laboratory of ASIC and Systems |
| 源URL | [http://119.78.100.186/handle/113462/136590]  |
| 专题 | 中国科学院近代物理研究所 |
| 通讯作者 | Chen, Gengsheng |
| 作者单位 | 1.Fudan Univ, Sch Microelect, Shanghai 310000, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 3.Fudan Microelect Co Ltd, Shanghai 200433, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang, Shu,Cai, Chang,Ning, Bingxu,et al. Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,2021,1012:11. |
| APA | Wang, Shu.,Cai, Chang.,Ning, Bingxu.,He, Ze.,Huang, Zhiqin.,...&Chen, Gengsheng.(2021).Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT,1012,11. |
| MLA | Wang, Shu,et al."Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 1012(2021):11. |
入库方式： OAI收割
来源：近代物理研究所
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