中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*

文献类型:期刊论文

作者Xu, Li-Jun1,2; Zhai, Peng-Fei1,2; Zhang, Sheng-Xia2; Zeng, Jian1,2; Hu, Pei-Pei2; Li, Zong-Zhen1,2; Liu, Li1,2; Sun, You-Mei1,2; Liu, Jie1,2
刊名CHINESE PHYSICS B
出版日期2020-09-01
卷号29期号:10页码:5
ISSN号1674-1056
关键词ion track MoS2 transmission electron microscopy (TEM) recrystallization
DOI10.1088/1674-1056/abad1e
通讯作者Zhai, Peng-Fei(zhaipengfei@impcas.ac.cn) ; Liu, Jie(j.liu@impcas.ac.cn)
英文摘要The various morphologies of tracks in MoS(2)irradiated by swift heavy ions at normal and 30 degrees incidence with 9.5-25.0 MeV/u(86)Kr,Xe-129,Ta-181, and(209)Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS(2)is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS2. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching.
WOS关键词MAGNETIC INSULATORS ; IRRADIATION
资助项目National Natural Science Foundation of China[11675233] ; National Natural Science Foundation of China[11690041] ; National Natural Science Foundation of China[11405229] ; National Natural Science Foundation of China[11705246] ; National Natural Science Foundation of China[11505243] ; Chinese Academy of Sciences ; Youth Innovation Promotion Association of Chinese Academy of Sciences[2020412]
WOS研究方向Physics
语种英语
出版者IOP PUBLISHING LTD
WOS记录号WOS:000575561200001
资助机构National Natural Science Foundation of China ; Chinese Academy of Sciences ; Youth Innovation Promotion Association of Chinese Academy of Sciences
源URL[http://119.78.100.186/handle/113462/139440]  
专题中国科学院近代物理研究所
通讯作者Zhai, Peng-Fei; Liu, Jie
作者单位1.Univ Chinese Acad Sci, Sch Nucl Sci & Technol, Beijing 100049, Peoples R China
2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714
Xu, Li-Jun,Zhai, Peng-Fei,Zhang, Sheng-Xia,et al. Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*[J]. CHINESE PHYSICS B,2020,29(10):5.
APA Xu, Li-Jun.,Zhai, Peng-Fei.,Zhang, Sheng-Xia.,Zeng, Jian.,Hu, Pei-Pei.,...&Liu, Jie.(2020).Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*.CHINESE PHYSICS B,29(10),5.
MLA Xu, Li-Jun,et al."Characterization of swift heavy ion tracks in MoS(2)by transmission electron microscopy*".CHINESE PHYSICS B 29.10(2020):5.

入库方式: OAI收割

来源:近代物理研究所

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