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A single-ion monitor based on coincident measurement of secondary electrons for single event effect research

文献类型：期刊论文

作者Jin, Ying1,2; Zhang, Yuezhao1; Liu, Junliang1,2; Yu, Deyang1,2; Wang, Hui1; Meng, Jun1,2; Guo, Tao3; Hui, Xinfei3; Li, Xiaoxiao1,2
刊名REVIEW OF SCIENTIFIC INSTRUMENTS
出版日期2020-04-01
卷号91期号:4页码:10
ISSN号0034-6748
DOI10.1063/1.5145223
通讯作者Liu, Junliang(liujunliang@impcas.ac.cn) ; Yu, Deyang(d.yu@impcas.ac.cn)
英文摘要Single-ion monitoring is a key requirement for many energetic heavy-ion experiments, e.g., the laboratory simulation of the single event effect of semiconductor devices under heavy ion bombardments. We have developed a two-dimensional position-sensitive and timing monitor of individual ions. It is composed of a thin aluminum foil, a pair of microchannel plate detectors, and electrostatic and magnetic fields. When energetic heavy ions pass through the aluminum foil, secondary electrons generated on each side of the foil are guided by the fields to the corresponding detector. Both the hitting position and the arrival time of the secondary electrons on corresponding detectors are measured in coincidence. A test with an Am-241 alpha source shows that the present monitor is capable of discriminating true events from heavy background radiations. A position resolution of 1.0 mm and a recording time resolution of 50 ns have been realized in the test.
WOS关键词MICROCHANNEL PLATE DETECTOR ; HEAVY-ION ; RESOLUTION
资助项目National Natural Science Foundation of China[11774356] ; National Natural Science Foundation of China[11405241] ; National Natural Science Foundation of China[11674333]
WOS研究方向Instruments & Instrumentation ; Physics
语种英语
WOS记录号WOS:000529944100001
出版者AMER INST PHYSICS
资助机构National Natural Science Foundation of China
源URL[http://119.78.100.186/handle/113462/140522]  
专题中国科学院近代物理研究所
通讯作者Liu, Junliang; Yu, Deyang
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
3.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China
推荐引用方式
GB/T 7714		 Jin, Ying,Zhang, Yuezhao,Liu, Junliang,et al. A single-ion monitor based on coincident measurement of secondary electrons for single event effect research[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2020,91(4):10.
APA Jin, Ying.,Zhang, Yuezhao.,Liu, Junliang.,Yu, Deyang.,Wang, Hui.,...&Li, Xiaoxiao.(2020).A single-ion monitor based on coincident measurement of secondary electrons for single event effect research.REVIEW OF SCIENTIFIC INSTRUMENTS,91(4),10.
MLA Jin, Ying,et al."A single-ion monitor based on coincident measurement of secondary electrons for single event effect research".REVIEW OF SCIENTIFIC INSTRUMENTS 91.4(2020):10.

入库方式： OAI收割

来源：近代物理研究所

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