Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates
文献类型：期刊论文
| 作者 | Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing |
| 刊名 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE
 |
| 出版日期 | 2021 |
| 卷号 | 68期号:9页码:2358-2366 |
| 语种 | 英语 |
| 公开日期 | 2021 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30852]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing. Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2021,68(9):2358-2366. |
| APA | Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing.(2021).Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,68(9),2358-2366. |
| MLA | Zhen, Zixin; Feng, Chun; Wang, Quan; Niu, Di; Wang, Xiaoliang; Tan, Manqing."Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 68.9(2021):2358-2366. |
入库方式： OAI收割
来源：半导体研究所
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