Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers
文献类型：期刊论文
| 作者 | Zhang, CM; Zhao, BC; Bin, XL; Zha, XW; Zhang
|
| 刊名 | optics communications
 |
| 出版日期 | 2003-11-15 |
| 卷号 | 227期号:4-6页码:221-225 |
| 关键词 | polarization interference imaging spectrometer modulation depth polarization orientation |
| ISSN号 | 0030-4018 |
| 通讯作者 | zhang |
| 英文摘要 | the influence of the orientations of both polarizer and analyzer on modulation depth of spatially distributed interferograms for static polarization interference imaging spectrometer (spiis) is analyzed. a generally, theoretical relationship to determine the modulation depth of a spiis is derived. the special cases of maximum modulation depth (v = 1) and the minimum modulation depth (v = 0) are examined. our results will provide a theoretical and practical guide for studying, developing and engineering polarization interference imaging spectrometers. (c) 2003 elsevier b.v. all rights reserved. |
| WOS标题词 | science & technology ; physical sciences |
| 学科主题 | 光学 |
| 类目[WOS] | optics |
| 研究领域[WOS] | optics |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000186468500003 |
| 公开日期 | 2010-01-12 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/5782]  |
| 专题 | 西安光学精密机械研究所_光学影像学习与分析中心 |
| 通讯作者 | Zhang |
| 作者单位 | 1.Xian Jiaotong Univ, Sch Sci, Xian 710049, Peoples R China 2.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710068, Peoples R China 3.Xian Inst Posts & Telecommun, Dept Math Phys, Xian 710061, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang, CM,Zhao, BC,Bin, XL,et al. Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers[J]. optics communications,2003,227(4-6):221-225. |
| APA | Zhang, CM,Zhao, BC,Bin, XL,Zha, XW,&Zhang.(2003).Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers.optics communications,227(4-6),221-225. |
| MLA | Zhang, CM,et al."Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers".optics communications 227.4-6(2003):221-225. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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